Multilevel operation of ferroelectric fet memory arrays considering current percolation paths impacting switching behavior F Müller, S De, R Olivo, M Lederer, A Altawil, R Hoffmann, T Kämpfe, T Ali, ... IEEE Electron Device Letters 44 (5), 757-760, 2023 | 13 | 2023 |
Enhanced reliability and trapping behavior in ferroelectric FETs under cryogenic conditions M Lederer, F Müller, R Hoffmann, R Olivo, Y Raffel, S Yang, S De, ... 2024 IEEE International Memory Workshop (IMW), 1-4, 2024 | | 2024 |