| IJTAG compatible analogue embedded instruments for MPSoC life-time prediction J Pathrose, G Ali, HG Kerkhoff 2018 IEEE 19th Latin-American Test Symposium (LATS), 1-4, 2018 | 10 | 2018 |
| Accessing on-chip temperature health monitors using the IEEE 1687 standard G Ali, A Badawy, HG Kerkhoff 2016 IEEE International Conference on Electronics, Circuits and Systems …, 2016 | 9 | 2016 |
| IJTAG compatible timing monitor with robust self-calibration for environmental and aging variation G Ali, J Pathrose, HG Kerkhoff 2019 IEEE European Test Symposium (ETS), 1-6, 2019 | 7 | 2019 |
| An automotive MP-SoC featuring an advanced embedded instrument infrastructure for high dependability HG Kerkhoff, G Ali, H Ebrahimi, A Ibrahim 2017 International Test Conference in Asia (ITC-Asia), 65-70, 2017 | 7 | 2017 |
| IJTAG Compatible Delay-line based Voltage Embedded Instrument with One Clock-Cycle Conversion Time G Ali, J Pathrose, HG Kerkhoff 2019 IEEE Latin American Test Symposium (LATS), 1-6, 2019 | 6 | 2019 |
| On-line management of temperature health monitors using the IEEE 1687 standard G Ali, A Badawy, H Kerkhoff TESTA, 2016 | 6 | 2016 |
| On-chip embedded instruments data fusion and life-time prognostics of dependable VLSI-SoCs using machine-learning G Ali, L Bagheriye, HG Kerkhoff 2020 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2020 | 5 | 2020 |
| Life-time prognostics of dependable VLSI-SoCs using machine-learning L Bagheriye, G Ali, HG Kerkhoff 2020 IEEE 26th International Symposium on On-Line Testing and Robust System …, 2020 | 4 | 2020 |
| Design and implementation of a dependable CPSoC for automotive applications G Ali, H Ebrahimi, J Pathrose, HG Kerkhoff 2018 IEEE Industrial Cyber-Physical Systems (ICPS), 246-251, 2018 | 4 | 2018 |
| Applying IJTAG-compatible embedded instruments for lifetime enhancement of analog front-ends of cyber-physical systems HG Kerkhoff, G Ali, J Wan, A Ibrahim, J Pathrose 2017 IFIP/IEEE International Conference on Very Large Scale Integration …, 2017 | 2 | 2017 |
| On-Chip Lifetime Prediction for Dependable Many-Processor SoCs Based on Data Fusion G Ali, J Pathrose, H Kerkhoff 2018 IEEE 12th International Symposium on Embedded Multicore/Many-core …, 2018 | 1 | 2018 |
| On-chip EOL Prognostics Using Data-Fusion of Embedded Instruments for Dependable MP-SoCs G Ali, L Bagheriye, H Manhaeve, HG Kerkhoff 2020 IEEE 29th Asian Test Symposium (ATS), 1-6, 2020 | | 2020 |
| Enhancing Physical Unclonable Function Robustness Employing Embedded Instruments J Pathrose, G Ali, HG Kerkhoff 2018 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS), 370-373, 2018 | | 2018 |
| Development of a Single-Chip Test and Debug Paltform using IEEE 1500 Standard G Ali Universiti Teknologi PETRONAS, 2015 | | 2015 |
| Enhancement in IEEE 1500 Standard for at-speed Test and Debug G Ali, FA Hussin, NBZ Ali, NH Hamid, RM Adnan 2014 IEEE Dallas Circuits and Systems Conference (DCAS), 1-4, 2014 | | 2014 |
| Enhancement in IEEE 1500 standard for at-speed functional testing G Ali, FA Hussin, NBZ Ali, NH Hamid 2014 5th International Conference on Intelligent and Advanced Systems (ICIAS …, 2014 | | 2014 |
| ON-BOARD FUNCTIONAL TEST AND DEBUG PLATFORM FOR PROCESSORS G ALI Universiti Teknologi PETRONAS, 2014 | | 2014 |
| On using IEEE 1500 standard for functional testing G Ali, FA Hussin, NBZ Ali, NH Hamid Fifth Asia Symposium on Quality Electronic Design (ASQED 2013), 39-46, 2013 | | 2013 |
Hans G. KerkhoffUniversity of Twente在 utwente.nl 的电子邮件经过验证
