关注
Nayeong Lee
Nayeong Lee
在 pusan.ac.kr 的电子邮件经过验证 - 首页
标题
引用次数
引用次数
年份
A Bias‐Dependent Weight Update Characteristics of Low Power Synaptic Pass‐Transistors with a Hf‐Doped ZnO Channel Layer
D Cha, J Pi, G Do, N Lee, K Tae, S Lee
Advanced Electronic Materials, 2400108, 2024
32024
Weight-Update Characteristics Dependent on Carrier Densities of Hf-ZnO Charge-Trap Layers in Sub-threshold Synaptic Transistors
K Tae, D Cha, G Do, N Lee, S Lee
IEEE Access, 2024
12024
Retention Characteristics Dependent on High-κ Gate-Insulator Stack in Hf-ZnO Synaptic Thin-Film Transistors
G Do, D Cha, K Tae, N Lee, S Byun, J Pi, S Lee
IEEE Access, 2024
12024
系统目前无法执行此操作,请稍后再试。
文章 1–3