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Hemanth Kumar Cheemalamarri
Hemanth Kumar Cheemalamarri
其他姓名Hemanth Kumar C, C.H. Kumar
Institute of Microelectronics - A*STAR Singapore | Indian institute of technology Hyderabad
在 iith.ac.in 的电子邮件经过验证
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引用次数
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年份
Interface and reliability analysis of Au-passivated Cu–Cu fine-pitch thermocompression bonding for 3-D IC applications
S Bonam, AK Panigrahi, CH Kumar, SRK Vanjari, SG Singh
IEEE Transactions on Components, Packaging and Manufacturing Technology 9 (7 …, 2019
492019
Direct, CMOS in-line process flow compatible, sub 100 C Cu–Cu thermocompression bonding using stress engineering
AK Panigrahi, T Ghosh, CH Kumar, SG Singh, SRK Vanjari
Electronic Materials Letters 14, 328-335, 2018
212018
Metal-alloy Cu surface passivation leads to high quality fine-pitch bump-less Cu-Cu bonding for 3D IC and heterogeneous integration applications
AK Panigrahi, CH Kumar, S Bonam, PK Brince, T Ghosh, N Paul, ...
2018 IEEE 68th Electronic Components and Technology Conference (ECTC), 1561-1566, 2018
132018
Optimized ultra-thin manganin alloy passivated fine-pitch damascene compatible bump-less Cu–Cu bonding at sub 200° C for three-dimensional Integration applications
AK Panigrahi, CH Kumar, S Bonam, T Ghosh, SRK Vanjari, SG Singh
Japanese Journal of Applied Physics 57 (2S1), 02BC04, 2017
122017
Effect of ultrathin palladium layer in achieving a low temperature and pressure wafer level aluminum to aluminum bonding
HK Cheemalamarri, S Bonam, SRK Vanjari, SG Singh
Surface Topography: Metrology and Properties 8 (4), 045008, 2020
72020
Noise performance improvement through optimized stacked layer of liner structure around the TSV in 3D IC
CH Kumar, AK Panigrahi, OK Singh, SG Singh
2016 IEEE International 3D Systems Integration Conference (3DIC), 1-4, 2016
52016
Improved noise coupling performance using optimized Teflon liner with different TSV structures for 3D IC integration
S Patil, AK Panigrahi, S Bonam, CH Kumar, OK Singh, SG Singh
2016 IEEE International 3D Systems Integration Conference (3DIC), 1-4, 2016
52016
Achieving of intensified conductive interconnections for Flex-on-Flex by using metal passivated Copper–Copper Thermocompression bonding
CH Kumar, S Bonam, N Paul, SRK Vanjari, SG Singh
2018 IEEE 68th Electronic Components and Technology Conference (ECTC), 1732-1737, 2018
42018
CMOS-compatible fine pitch Al-Al bonding
HK Cheemalamarri, B Varghese, S Jaibir, L Hongyu, CR SS, N Singh, ...
2023 IEEE 73rd Electronic Components and Technology Conference (ECTC), 1725-1729, 2023
32023
Fabrication of On-Silicon Aperture Coupled Patch Antenna Through Micromachining and Cu-Cu Thermocompression Bonding
S Bonam, J Joseph, CH Kumar, AK Panigrahi, SRK Vanjari, SG Singh
IEEE Transactions on Semiconductor Manufacturing 35 (4), 626-632, 2022
32022
Ultrathin New Dielectric Interlayer Layer-Enhancer for TEOS-TEOS Bond Strength at Low Thermal Budget for C2W and W2W Bonding Applications
HK Cheemalamarri, SLH Jang, JH Miao, V Nandini, CR BSS, CK Jien, ...
2023 IEEE 25th Electronics Packaging Technology Conference (EPTC), 625-628, 2023
22023
Diffusion Enhanced Optimized Thin Passivation Layer for Realizing Copper to Copper Wafer Bonding at Low Thermal Budget
S Bonam, HK Cheemalamarri, SRK Vanjari, SG Singh
2022 IEEE 24th Electronics Packaging Technology Conference (EPTC), 344-347, 2022
22022
Ti/Si interface enabling complementary metal oxide semiconductor compatible, high reliable bonding for inter-die micro-fluidic cooling for future advanced 3D integrated circuit …
HK Cheemalamarri, S Bonam, SRK Vanjari, SG Singh
Journal of Micromechanics and Microengineering 30 (10), 105005, 2020
22020
Gold Passivated Cu-Cu Bonding at 140 C For 3D IC Packaging and Heterogeneous Integration Applications
S Bonam, CH Kumar, SRK Vanjari, SG Singh
2018 IEEE 20th Electronics Packaging Technology Conference (EPTC), 547-550, 2018
22018
High Density metal alloy Interconnections Using Novel Wafer Bonding Approach For 3D IC Packaging Applications
CH Kumar, S Bonam, SRK Vanjari, SG Singh
2018 IEEE 20th Electronics Packaging Technology Conference (EPTC), 625-628, 2018
12018
Vanadium Pentoxide Nanofibers as IR sensors for Bolometer applications
N Paul, S Vadnala, AK Panigrahi, CH Kumar, A Agrawal, SG Singh
ECS Transactions 85 (13), 1573, 2018
12018
Optimized ultra-thin Manganin alloy passivated fine-pitch damascene compatible Cu-Cu bonding at sub 200° C for 3D IC integration
AK Panigrahi, CH Kumar, T Ghosh, SRK Vanjari, SG Singh
2017 5th International Workshop on Low Temperature Bonding for 3D …, 2017
12017
Facile approach of enhanced heat mitigation between 3D stacked layers by Introducing a sub-micron thick heat spreading materials
CH Kumar, AK Panigrahi, P Supraja, N Paul, SG Singh
12017
Dielectric Stack Optimization for Die-level Warpage Reduction for Chip-to-Wafer Hybrid Bonding
BSSC Rao, MD Kumar, VN Sekhar, IC Daniel, SK Tippabhotla, SC Chong, ...
2024 IEEE 74th Electronic Components and Technology Conference (ECTC), 62-68, 2024
2024
Cu/Dielectric hybrid bonding among Glass and Si
HK Cheemalamarri, A Sundaram, TVN Anh, YJ Ok, VS Rao, N Singh
2024 IEEE 74th Electronic Components and Technology Conference (ECTC), 1543-1547, 2024
2024
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