| Combined quartz crystal microbalance with dissipation (QCM-D) and generalized ellipsometry (GE) to characterize the deposition of titanium dioxide nanoparticles on model rough … N Kananizadeh, C Rice, J Lee, KB Rodenhausen, D Sekora, M Schubert, ... Journal of hazardous materials 322, 118-128, 2017 | 28 | 2017 |
| Ion beam sputtering of Ti: Influence of process parameters on angular and energy distribution of sputtered and backscattered particles T Lautenschläger, R Feder, H Neumann, C Rice, M Schubert, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2016 | 26 | 2016 |
| Use of precisely sculptured thin film (STF) substrates with generalized ellipsometry to determine spatial distribution of adsorbed fibronectin to nanostructured columnar … T Kasputis, A Pieper, KB Rodenhausen, D Schmidt, D Sekora, C Rice, ... Acta biomaterialia 18, 88-99, 2015 | 23 | 2015 |
| Optical anisotropy of porous polymer film with inverse slanted nanocolumnar structure revealed via generalized spectroscopic ellipsometry D Liang, D Sekora, C Rice, E Schubert, M Schubert Applied Physics Letters 107 (7), 2015 | 9 | 2015 |
| Detection of organic attachment onto highly ordered three-dimensional nanostructure thin films by generalized ellipsometry and quartz crystal microbalance with dissipation … KB Rodenhausen, D Schmidt, C Rice, T Hofmann, E Schubert, ... Ellipsometry of Functional Organic Surfaces and Films, 135-154, 2014 | 8 | 2014 |
| Control of slanting angle, porosity, and anisotropic optical constants of slanted columnar thin films via in situ nucleation layer tailoring C Rice, A Mock, D Sekora, D Schmidt, T Hofmann, E Schubert, ... Applied Surface Science 421, 766-771, 2017 | 7 | 2017 |
| Measure the deposition of titanium dioxide nanoparticles on model rough surfaces using generalized ellipsometry technique N Kananizadeh, D Peev, C Rice, T Hofmann, M Schubert, S Bartelt-Hunt, ... ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY 250, 2015 | | 2015 |
