| Survey of low power testing of VLSI circuits P Basker, A Arulmurugan 2012 International Conference on Computer Communication and Informatics, 1-7, 2012 | 26 | 2012 |
| Design and implementation of physical unclonable function in field programmable gate array B Vivek, A Arulmurugan, S Maheswaran, S Dhamodharan, AS Dharunash, ... 2023 8th International Conference on Communication and Electronics Systems …, 2023 | 9 | 2023 |
| Development of LPG leakage detection alert and auto exhaust system using IoT K Gavaskar, D Malathi, G Ravivarma, A Arulmurugan 2021 7th International Conference on Electrical Energy Systems (ICEES), 558-563, 2021 | 9 | 2021 |
| Thermal-aware test data compression for system-on-chip based on modified bitmask based methods A Arulmurugan, G Murugesan, B Vivek Journal of Electronic Testing 36, 577-590, 2020 | 5 | 2020 |
| Improvement of test data compression using combined encoding S Mirthulla, A Arulmurugan 2015 2nd International Conference on Electronics and Communication Systems …, 2015 | 5 | 2015 |
| XG Boost Algorithm based Hardware Trojan Detection in Hardware Circuits A Vennila, S Balambigai, A Arulmurugan, M Hema, M Kamali, M Kishore 2023 Fifth International Conference on Electrical, Computer and …, 2023 | 4 | 2023 |
| A novel strategy for implementation of intelligent techniques in solar photovoltaic arrays to improve the performance and various comparison of partial shading mitigating … E Kannan, M Avudaiappan, S Kaliyaperumal, S Muthusamy, H Panchal, ... Energy Sources, Part A: Recovery, Utilization, and Environmental Effects 44 …, 2022 | 4 | 2022 |
| A low-power True Single Phase Clock scan cell design for VLSI testing A Arulmurgan, VR Roobiha, G Narendran, K Praneshkumar, C Gokul Materials Today: Proceedings 45, 3153-3156, 2021 | 2 | 2021 |
| FPGA Implementation of RO-PUF using Chaotic Maps A Azhaganantham, M Kanimozhi, TS Gowtham, S Jayasuriya 2023 Third International Conference on Artificial Intelligence and Smart …, 2023 | 1 | 2023 |
| Genetic Algorithm-based thermal uniformity–aware X-filling to reduce peak temperature during testing A Azhaganantham, M Govindasamy Measurement and Control 51 (7-8), 235-242, 2018 | 1 | 2018 |
Govindasamy MurugesanProfessor of ECE, Kongu Engineering College在 kongu.ac.in 的电子邮件经过验证
