关注
Julius F. Keckes
Julius F. Keckes
在 unileoben.ac.at 的电子邮件经过验证 - 首页
标题
引用次数
引用次数
年份
Inconel-steel multilayers by liquid dispersed metal powder bed fusion: Microstructure, residual stress and property gradients
SC Bodner, LTG van De Vorst, J Zalesak, J Todt, JF Keckes, ...
Additive Manufacturing 32, 101027, 2020
402020
Evolution of structure and residual stress of a fcc/hex-AlCrN multi-layered system upon thermal loading revealed by cross-sectional X-ray nano-diffraction
N Jäger, S Klima, H Hruby, J Julin, M Burghammer, JF Keckes, C Mitterer, ...
Acta materialia 162, 55-66, 2019
352019
Multi-scale interface design of strong and damage resistant hierarchical nanostructured materials
R Daniel, M Meindlhumer, J Zalesak, W Baumegger, J Todt, ...
Materials & Design 196, 109169, 2020
252020
Biomimetic hard and tough nanoceramic Ti–Al–N film with self-assembled six-level hierarchy
M Meindlhumer, J Zalesak, R Pitonak, J Todt, B Sartory, M Burghammer, ...
Nanoscale 11 (16), 7986-7995, 2019
252019
Nanoscale residual stress and microstructure gradients across the cutting edge area of a TiN coating on WCCo
M Meindlhumer, N Jäger, S Spor, M Rosenthal, JF Keckes, H Hruby, ...
Scripta materialia 182, 11-15, 2020
232020
Structure-stress relationships in nanocrystalline multilayered Al0. 7Cr0. 3N/Al0. 9Cr0. 1N coatings studied by cross-sectional X-ray nanodiffraction
S Klima, N Jäger, H Hruby, C Mitterer, JF Keckes, M Burghammer, ...
Materials & Design 170, 107702, 2019
142019
Neural network supported microscale in situ deformation tracking: a comparative study of testing geometries
JF Keckes, A Jelinek, D Kiener, M Alfreider
JOM 76 (5), 2336-2351, 2024
22024
Exploring Refinement Characteristics in FeTi‐Cu x Composites: A Study of Localization and Abrasion Constraints
L Schweiger, F Spieckermann, N Buchebner, JF Keckes, D Kiener, ...
Advanced Engineering Materials, 2024
2024
Mapping strain across Co80Ta7B13/Co62Ta6B32 glassy interfaces
S Evertz, J Zálešák, M Hans, HC Jansen, JF Keckes, H Sheng, J Eckert, ...
Materials & Design 234, 112327, 2023
2023
Probing local atomic strain of metallic glasses with nanometer resolution using TEM diffraction mapping
J Keckes
University of Leoben, 2022
2022
Software Package to evaluate two-dimensional X-ray nanodiffraction data from thin films
J Keckes, M Stefenelli, J Todt, C Mitterer, R Daniel, J Keckes
2015
系统目前无法执行此操作,请稍后再试。
文章 1–11