关注
Dr. Dhananjay Panchagade
Dr. Dhananjay Panchagade
Associate Professor, Fr. C. Rodrigues Institute of Technology, Vashi, Navi Mumbai, India
在 fcrit.ac.in 的电子邮件经过验证
标题
引用次数
引用次数
年份
Models for reliability prediction of fine-pitch BGAs and CSPs in shock and drop-impact
P Lall, DR Panchagade, Y Liu, RW Johnson, JC Suhling
IEEE Transactions on Components and Packaging Technologies 29 (3), 464-474, 2006
1832006
Failure-Envelope Approach to Modeling Shock and Vibration Survivability of Electronic and MEMS Packaging
P Lall, DR Panchagade, P Choudhary, S Gupte, JC Suhling
Components and Packaging Technologies, IEEE Transactions on 31 (1), 104-113, 2008
1402008
Smeared-property models for shock-impact reliability of area-array packages
P Lall, D Panchagade, Y Liu, W Johnson, J Suhling
1052007
High speed digital image correlation for transient-shock reliability of electronics
P Lall, D Panchagade, D Iyengar, S Shantaram, J Suhling, H Schrier
2007 Proceedings 57th Electronic Components and Technology Conference, 924-939, 2007
962007
Design envelopes and optical feature extraction techniques for survivability of SnAg leadfree packaging architectures under shock and vibration
P Lall, D Iyengar, S Shantaram, R Pandher, D Panchagade, J Suhling
2008 58th Electronic Components and Technology Conference, 1036-1047, 2008
912008
Modeling moisture ingress through polyisobutylene‐based edge‐seals
MD Kempe, D Panchagade, MO Reese, AA Dameron
Progress in Photovoltaics: Research and Applications 23 (5), 570-581, 2015
622015
Peridynamic-models using finite elements for shock and vibration reliability of leadfree electronics
P Lall, S Shantaram, D Panchagade
2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical …, 2010
532010
Ball grid array (BGA) solder joint intermittency detection: SJ BIST
JP Hofmeister, P Lall, D Panchagade, NN Roth, TA Tracy, JB Judkins, ...
2008 IEEE Aerospace Conference, 1-11, 2008
502008
Keynote Presentation: Feature extraction and health monitoring using image correlation for survivability of leadfree packaging under shock and vibration
P Lall, D Iyengar, SS Shantaram, P Gupta, D Panchagade, J Suhling
Proceedings of the 9th International Conference on Thermal, Mechanical, and …, 2008
382008
Digital-image correlation and XFEM based shock-reliability models for leadfree and advanced interconnects
P Lall, M Kulkarni, A Angral, D Panchagade, J Suhling
2010 Proceedings 60th Electronic Components and Technology Conference (ECTC …, 2010
292010
Fault-mode classification for health monitoring of electronics subjected to drop and shock
P Lall, P Gupta, D Panchagade, A Angral
2009 59th Electronic Components and Technology Conference, 668-681, 2009
292009
Self-organized mapping of failure modes in portable electronics subjected to drop and shock
P Lall, P Gupta, D Panchagade
2010 Proceedings 60th Electronic Components and Technology Conference (ECTC …, 2010
232010
Life prediction and damage equivalency for shock survivability of electronic components
P Lall, D Panchagade, D Iyengar, J Suhling
Thermal and Thermomechanical Proceedings 10th Intersociety Conference on …, 2006
202006
Feature extraction and health monitoring using image correlation for survivability of leadfree packaging under shock and vibration
P Lall, D Iyengar, S Shantaram, P Gupta, D Panchagade, J Suhling
EuroSimE 2008-International Conference on Thermal, Mechanical and Multi …, 2008
102008
Fault-isolation in portable electronics subjected to drop and shock
P Lall, P Gupta, D Panchagade, A Angral
2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical …, 2010
92010
Prognostics and condition monitoring of electronics
P Lall, P Gupta, D Panchagade, M Kulkarni, J Suhling, J Hofmeister
EuroSimE 2009-10th International Conference on Thermal, Mechanical and Multi …, 2009
52009
Damage Progression Using Speckle‐Correlation and High‐Speed Imaging for Survivability of Leadfree Packaging Under Shock
P Lall, D Iyengar, S Shantaram, D Panchagade
Strain 45 (3), 267-282, 2009
32009
Development of survivability envelopes for SnAg leadfree packaging architecures under shock and vibration
P Lall, D Iyengar, S Shantaram, D Panchagade, J Suhling
2008 11th Intersociety Conference on Thermal and Thermomechanical Phenomena …, 2008
32008
Prognostication and health monitoring of electronics in implantable biological systems
P Lall, P Gupta, M Kulkarni, D Panchagade, J Suhling, J Hofmeister
ASME International Mechanical Engineering Congress and Exposition 48630, 657-671, 2008
32008
Predicting the Performance of Edge Seal Materials for PV
M Kempe, D Panchagade, A Dameron, M Reese
3*
系统目前无法执行此操作,请稍后再试。
文章 1–20