| Cantilever-based sensing: the origin of surface stress and optimization strategies M Godin, V Tabard-Cossa, Y Miyahara, T Monga, PJ Williams, ... Nanotechnology 21 (7), 075501, 2010 | 187 | 2010 |
| Detection of Single-Electron Charging in an Individual InAs Quantum Dot<? format?> by Noncontact Atomic-Force Microscopy R Stomp, Y Miyahara, S Schaer, Q Sun, H Guo, P Grutter, S Studenikin, ... Physical review letters 94 (5), 056802, 2005 | 166 | 2005 |
| Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopy L Cockins, Y Miyahara, SD Bennett, AA Clerk, S Studenikin, P Poole, ... Proceedings of the National Academy of Sciences 107 (21), 9496-9501, 2010 | 110 | 2010 |
| Strong electromechanical coupling of an atomic force microscope cantilever to a quantum dot SD Bennett, L Cockins, Y Miyahara, P Grütter, AA Clerk Physical review letters 104 (1), 017203, 2010 | 110 | 2010 |
| Decoupling conservative and dissipative forces in frequency modulation atomic force microscopy A Labuda, Y Miyahara, L Cockins, PH Grütter Physical Review B—Condensed Matter and Materials Physics 84 (12), 125433, 2011 | 69 | 2011 |
| Determination of the local contact potential difference of PTCDA on NaCl: a comparison of techniques SA Burke, JM LeDue, Y Miyahara, JM Topple, S Fostner, P Grütter Nanotechnology 20 (26), 264012, 2009 | 68 | 2009 |
| Retrofitting an atomic force microscope with photothermal excitation for a clean cantilever response in low Q environments A Labuda, K Kobayashi, Y Miyahara, P Grütter Review of Scientific Instruments 83 (5), 2012 | 64 | 2012 |
| From tunneling to point contact: Correlation between forces and current Y Sun, H Mortensen, S Schär, AS Lucier, Y Miyahara, P Grütter, W Hofer Physical Review B—Condensed Matter and Materials Physics 71 (19), 193407, 2005 | 59 | 2005 |
| Non-contact atomic force microscope with a PZT cantilever used for deflection sensing, direct oscillation and feedback actuation Y Miyahara, M Deschler, T Fujii, S Watanabe, H Bleuler Applied surface science 188 (3-4), 450-455, 2002 | 57 | 2002 |
| Minimum threshold for incipient plasticity in the atomic-scale nanoindentation of Au (111) W Paul, D Oliver, Y Miyahara, PH Grütter Physical review letters 110 (13), 135506, 2013 | 52 | 2013 |
| Lead zirconate titanate cantilever for noncontact atomic force microscopy Y Miyahara, T Fujii, S Watanabe, A Tonoli, S Carabelli, H Yamada, ... Applied surface science 140 (3-4), 428-431, 1999 | 49 | 1999 |
| Nanopore Formation via Tip‐Controlled Local Breakdown Using an Atomic Force Microscope Y Zhang, Y Miyahara, N Derriche, W Yang, K Yazda, X Capaldi, Z Liu, ... Small Methods 3 (7), 1900147, 2019 | 48 | 2019 |
| The limit of time resolution in frequency modulation atomic force microscopy by a pump-probe approach Z Schumacher, A Spielhofer, Y Miyahara, P Grutter Applied Physics Letters 110 (5), 2017 | 48 | 2017 |
| Measurement of surface photovoltage by atomic force microscopy under pulsed illumination Z Schumacher, Y Miyahara, A Spielhofer, P Grutter Physical Review Applied 5 (4), 044018, 2016 | 46 | 2016 |
| Quantum state readout of individual quantum dots by electrostatic force detection Y Miyahara, A Roy-Gobeil, P Grutter Nanotechnology 28 (6), 064001, 2017 | 38 | 2017 |
| Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope T Hagedorn, ME Ouali, W Paul, D Oliver, Y Miyahara, P Grütter Review of Scientific Instruments 82 (11), 2011 | 38 | 2011 |
| Rapid mechanically controlled rewiring of neuronal circuits MH Magdesian, GM Lopez-Ayon, M Mori, D Boudreau, ... Journal of Neuroscience 36 (3), 979-987, 2016 | 36 | 2016 |
| Measuring spatially resolved collective ionic transport on lithium battery cathodes using atomic force microscopy A Mascaro, Z Wang, P Hovington, Y Miyahara, A Paolella, V Gariepy, ... Nano letters 17 (7), 4489-4496, 2017 | 32 | 2017 |
| Conductivity of an atomically defined metallic interface DJ Oliver, J Maassen, M El Ouali, W Paul, T Hagedorn, Y Miyahara, Y Qi, ... Proceedings of the National Academy of Sciences 109 (47), 19097-19102, 2012 | 32 | 2012 |
| Tip-induced artifacts in magnetic force microscopy images O Iglesias-Freire, JR Bates, Y Miyahara, A Asenjo, PH Grütter Applied Physics Letters 102 (2), 2013 | 31 | 2013 |
Peter GrutterMcGill University在 physics.mcgill.ca 的电子邮件经过验证
