| A Generic Trap Generation Framework for MOSFET Reliability—Part I: Gate Only Stress–BTI, SILC, and TDDB S Mahapatra, A Ansari, AS Bisht, N Choudhury, N Parihar, P Chatterjee, ... IEEE Transactions on Electron Devices, 2023 | 7 | 2023 |
| A Device to Circuit Framework for NBTI P Chatterjee, K Thakor, AS Bisht, A Ansari, S Samaga, S Mahapatra 2023 IEEE International Integrated Reliability Workshop (IIRW), 1-6, 2023 | 2 | 2023 |
| A physics-based model for long term data retention characteristics in 3D NAND flash memory R Saikia, A Ansari, S Mahapatra 2023 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2023 | 2 | 2023 |
| Comparative analysis of NBTI modeling frameworks BAT and Comphy AI Ansari, N Choudhury, N Parihar, S Mahapatra Solid-State Electronics 200, 108549, 2023 | | 2023 |
| Theoretical Analysis of an Inverse Radon Transform Based Multicomponent Micro-Doppler Parameter Estimation Algorithm S Sharma, A Girish, NP Rakhashia, VM Gadre, SU Haque, A Ansari, ... 2022 National Conference on Communications (NCC), 70-75, 2022 | | 2022 |
