| InGaN/GaN multiple-quantum-well light-emitting diodes grown on Si (111) substrates with ZrB2 (0001) buffer layers AH Blake, D Caselli, C Durot, J Mueller, E Parra, J Gilgen, A Boley, ... Journal of Applied Physics 111 (3), 2012 | 33 | 2012 |
| Investigation of defect creation in GaP/Si (0 0 1) epitaxial structures C Zhang, A Boley, N Faleev, DJ Smith, CB Honsberg Journal of Crystal Growth 503, 36-44, 2018 | 19 | 2018 |
| Substrate‐independent analysis of microcrystalline silicon thin films using UV Raman spectroscopy JV Carpenter III, M Bailly, A Boley, J Shi, M Minjares, DJ Smith, S Bowden, ... physica status solidi (b) 254 (9), 1700204, 2017 | 12 | 2017 |
| Effect of spacer layer thickness on structural and optical properties of multi-stack InAs/GaAsSb quantum dots Y Kim, KY Ban, A Boley, DJ Smith, CB Honsberg Applied Physics Letters 107 (17), 2015 | 12 | 2015 |
| Structure and morphology of polar and semi-polar pyramidal surfaces coating wurtzite ZnO micro-wires D Tang, LF Allard, A Boley, DJ Smith, J Liu Journal of Materials Science 48 (10), 3857-3862, 2013 | 10 | 2013 |
| Applied Physics Reviews C Zhang, F Li, JL Zhu, JG Lu, J Qiang, EW Zhong, ZC Ye, Z He, X Guo, ... Appl. Phys. Lett 141905 (10.1063/1.4915604), 106, 2015 | 2 | 2015 |
| Interfacial intermixing and anti-phase boundaries in GaP/Si (0 0 1) heterostructures A Boley, E Luna, C Zhang, N Faleev, CB Honsberg, DJ Smith Journal of Crystal Growth 562, 126059, 2021 | 1 | 2021 |
| Transmission Electron Microscopy Characterization of Photovoltaic Semiconductor Materials A Boley Arizona State University, 2020 | 1 | 2020 |
| Characterization of AlGaN-based GRINSCH using TEM and electron holography A Boley, H Sun, M McCartney, D Smith, T Moustakas Microscopy and Microanalysis 19 (S2), 1382-1383, 2013 | 1 | 2013 |
| Initial Considerations for Accessibility in Microscopy A Boley Microscopy and Microanalysis 29 (Supplement_1), 2049-2049, 2023 | | 2023 |
| Epitaxial GaP Layers Grown on Si Substrates using Migration Enhanced and Molecular Beam Epitaxy C Zhang, A Boley, N Faleev, DJ Smith, CB Honsberg 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC), 2573-2575, 2017 | | 2017 |
| TEM Characterization of InAs Quantum Dots with GaAsSb Spacer Layers A Boley, Y Kim, KY Ban, CB Honsberg, DJ Smith Microscopy and Microanalysis 22 (S3), 1656-1657, 2016 | | 2016 |
| Characterization of N-polar GaN/AlGaN/GaN heterostructures using electron holography A Boley, DF Storm, MR McCartney, DJ Smith Microscopy and Microanalysis 20 (S3), 258-259, 2014 | | 2014 |
| Cross-Sectional Characterization of Defects in GaN MQW LEDs A Boley, I Tsong, DJ Smith Microscopy and Microanalysis 18 (S2), 1816-1817, 2012 | | 2012 |
