| How innovations in methodology offer new prospects for volume electron microscopy AJ Kievits, R Lane, EC Carroll, JP Hoogenboom Journal of Microscopy 287 (3), 114-137, 2022 | 17 | 2022 |
| Optical STEM detection for scanning electron microscopy AJ Kievits, BHP Duinkerken, J Fermie, R Lane, BNG Giepmans, ... Ultramicroscopy 256, 113877, 2024 | 2 | 2024 |
| FAST-EM array tomography: a workflow for multibeam volume electron microscopy AJ Kievits, BHP Duinkerken, R Lane, C de Heus, ... Methods in Microscopy, 2024 | | 2024 |
| BIB-mSTEM Approach for Large Scale Acquisition of Brain Tissue M Kormacheva, A Kievits, J Reuteler, M Niessen, S Hoedt, S Khan, ... Microscopy and Microanalysis 30 (Supplement_1), ozae044. 328, 2024 | | 2024 |
| Need for Speed: Imaging Biological Ultrastructure with the 64-beams FAST-EM AJ Kievits, BH Peter Duinkerken, BNG Giepmans, JP Hoogenboom Microscopy and Microanalysis 29 (Supplement_1), 2105-2106, 2023 | | 2023 |
| Characterization and Optimization of OSTEM; A Novel Detection Method for Single-and Multi-Beam Scanning Electron Microscopy A Kievits, J Fermie, P Duinkerken, R Lane, E Carroll, B Giepmans, ... Microscopy and Microanalysis 28 (S1), 1458-1460, 2022 | | 2022 |
Jacob Hoogenboomassociate professor, Department of Imaging Physics, Technische Universiteit Delft在 tudelft.nl 的电子邮件经过验证
