| Quantitative material analysis using secondary electron energy spectromicroscopy W Han, M Zheng, A Banerjee, YZ Luo, L Shen, A Khursheed Scientific reports 10 (1), 22144, 2020 | 18 | 2020 |
| Secondary electron energy contrast of localized buried charge in metal–insulator–silicon structures A Srinivasan, W Han, A Khursheed Microscopy and Microanalysis 24 (5), 453-460, 2018 | 7 | 2018 |
| Beyond conventional secondary electron imaging using spectromicroscopy and its applications in dopant profiling W Han, A Srinivasan, A Banerjee, M Chew, A Khursheed Materials Today Advances 2, 100012, 2019 | 6 | 2019 |
| A parallel radial mirror energy analyzer attachment for the scanning electron microscope KH Cheong, W Han, A Khursheed, K Nelliyan Microscopy and Microanalysis 21 (S4), 142-147, 2015 | 5 | 2015 |
| Characterization of materials using the secondary electron energy spectromicroscopy technique A Srinivasan, W Han, M Zheng, A Khursheed Optical Materials: X 12, 100121, 2021 | 1 | 2021 |
| Quantitative material analysis using secondary electron energy spectromicroscopy (vol 10, 22144, 2020) W Han, M Zheng, A Banerjee, YZ Luo, L Shen, A Khursheed SCIENTIFIC REPORTS 11 (1), 2021 | | 2021 |
| Author Correction: Quantitative material analysis using secondary electron energy spectromicroscopy W Han, M Zheng, A Banerjee, YZ Luo, L Shen, A Khursheed Scientific Reports 11, 2021 | | 2021 |
| Secondary Electron Spectroscopy Inside the Scanning Electron Microscope and Its Material Science Applications H Weiding PQDT-Global, 2019 | | 2019 |
