| The process chemometrics approach to process monitoring and fault detection BM Wise, NB Gallagher Journal of Process Control 6 (6), 329-348, 1996 | 1085 | 1996 |
| A comparison of principal component analysis, multiway principal component analysis, trilinear decomposition and parallel factor analysis for fault detection in a semiconductor … BM Wise, NB Gallagher, SW Butler, DD White, GG Barna Journal of Chemometrics 13 (3‐4), 379-396, 1999 | 352 | 1999 |
| A theoretical basis for the use of principal component models for monitoring multivariate processes BM Wise, NL Ricker, DF Veltkamp, BR Kowalski Process control and quality 1 (1), 41-51, 1990 | 308 | 1990 |
| PLS Toolbox 2.0 for use with MATLAB BM Wise, NB Gallagher, R Bro, JM Shaver, W Windig, RS Koch Eigenvector Research Inc., Manson, WA, 2006 | 274* | 2006 |
| PLS Toolbox 4.0 BM Wise, NB Gallagher, R Bro, J Shaver, W Windig, RS Koch | 186 | 2007 |
| Chemometrics tutorial for PLS_Toolbox and Solo BM Wise, NB Gallagher, R Bro, JM Shaver, W Windig, RS Koch Eigenvector Research, Inc 3905, 102-159, 2006 | 182 | 2006 |
| PLS Toolbox 3.5 for use with Matlab BM Wise, NB Gallagher, R Bro, JM Shaver, W Windig, RS Koch Manson, WA: Eigenvector Research Inc, 2005 | 145 | 2005 |
| Pre‐whitening of data by covariance‐weighted pre‐processing H Martens, M Høy, BM Wise, R Bro, PB Brockhoff Journal of Chemometrics: A Journal of the Chemometrics Society 17 (3), 153-165, 2003 | 133 | 2003 |
| Hydrogen bond acidic polymers for surface acoustic wave vapor sensors and arrays JW Grate, SJ Patrash, SN Kaganove, BM Wise Analytical Chemistry 71 (5), 1033-1040, 1999 | 130 | 1999 |
| Development and benchmarking of multivariate statistical process control tools for a semiconductor etch process: improving robustness through model updating NB Gallagher, BM Wise, SW Butler, DD White Jr, GG Barna IFAC Proceedings Volumes 30 (9), 79-84, 1997 | 127 | 1997 |
| Recent advances in multivariate statistical process control: improving robustness and sensitivity BM Wise, NL Ricker Proceedings of the IFAC. ADCHEM Symposium, 125-130, 1991 | 116 | 1991 |
| Curve resolution for multivariate images with applications to TOF-SIMS and Raman NB Gallagher, JM Shaver, EB Martin, J Morris, BM Wise, W Windig Chemometrics and intelligent laboratory systems 73 (1), 105-117, 2004 | 107 | 2004 |
| Method for unknown vapor characterization and classification using a multivariate sorption detector. Initial derivation and modeling based on polymer-coated acoustic wave … JW Grate, BM Wise, MH Abraham Analytical Chemistry 71 (20), 4544-4553, 1999 | 106 | 1999 |
| Canonical partial least squares and continuum power regression S Jong, BM Wise, NL Ricker Journal of Chemometrics: A Journal of the Chemometrics Society 15 (2), 85-100, 2001 | 92 | 2001 |
| Simultaneous fault detection and classification for semiconductor manufacturing tools BE Goodlin, DS Boning, HH Sawin, BM Wise Journal of the Electrochemical Society 150 (12), G778, 2003 | 90 | 2003 |
| PLS Toolbox for Use with MATLAB BM Wise, NB Gallagher Eigenvector Technologies: West Richland, WA, USA, 1998 | 90 | 1998 |
| Prediction of nucleating sequences from amyloidogenic propensities of tau-related peptides FA Rojas Quijano, D Morrow, BM Wise, FL Brancia, WJ Goux Biochemistry 45 (14), 4638-4652, 2006 | 89 | 2006 |
| A new approach for interactive self-modeling mixture analysis W Windig, NB Gallagher, JM Shaver, BM Wise Chemometrics and Intelligent Laboratory Systems 77 (1-2), 85-96, 2005 | 86 | 2005 |
| Application of multi-way principal components analysis to nuclear waste storage tank monitoring NB Gallagher, BM Wise, CW Stewart Computers & chemical engineering 20, S739-S744, 1996 | 83 | 1996 |
| Application of PARAFAC2 to fault detection and diagnosis in semiconductor etch BM Wise, NB Gallagher, EB Martin Journal of Chemometrics: A Journal of the Chemometrics Society 15 (4), 285-298, 2001 | 71 | 2001 |
