| Quality Prediction in Semiconductor Manufacturing processes Using Multilayer Perceptron Feedforward Artificial Neural Network* M Al-Kharaz, B Ananou, M Ouladsine, M Combal, J Pinaton 2019 8th international conference on systems and control (ICSC), 423-428, 2019 | 11 | 2019 |
| Cost-performance framework for the assessment of Modular Multilevel Converter in HVDC transmission applications N Evans, P Dworakowski, M Al-Kharaz, S Hegde, E Perez, F Morel IECON 2019-45th Annual Conference of the IEEE Industrial Electronics Society …, 2019 | 9 | 2019 |
| Evaluation of alarm system performance and management in semiconductor manufacturing M Al-Kharaz, B Ananou, M Ouladsine, M Combal, J Pinaton 2019 6th International Conference on Control, Decision and Information …, 2019 | 7 | 2019 |
| Indicator of Alarm Risk on Product Degradation, Prediction for Alarms Grouping, Using Alarms Data in Semiconductor Manufacturing* M Al-Kharaz, B Ananou, M Ouladsine, M Combal, J Pinaton 2019 IEEE 58th Conference on Decision and Control (CDC), 4741-4746, 2019 | 3 | 2019 |
| Data-Based Approach for Final Product Quality Inspection: Application to a Semiconductor Industry M Al-Kharaz, B Ananou, M Ouladsine, M Combal, J Pinaton 2021 60th IEEE Conference on Decision and Control (CDC), 1356-1362, 2021 | 2 | 2021 |
| Combining approaches of brownian motion and similarity principle to improve the remaining useful life prediction D El Jamal, M Al-Kharaz, B Ananou, G Graton, M Ouladsine, J Pinaton 2021 IEEE International Conference on Prognostics and Health Management …, 2021 | 2 | 2021 |
| Demand Forecasting in Hospital and ICUs using a Modified Propagation Dynamic Model: A novel GSEIR approach Y Trardi, M Al-kharaz, B Ananou, M Ouladsine IFAC-PapersOnLine 55 (10), 412-417, 2022 | | 2022 |
| Alarm Activations Analysis for Performance Enhancement in a Semiconductor Facility M Al-kharaz, B Ananou, M Ouladsine, M Combal, J Pinaton IFAC-PapersOnLine 55 (6), 439-444, 2022 | | 2022 |
| Analyse multivariée des alarmes de diagnostic en vue de la prédiction de la qualité des produits M Al-Kharaz Aix-Marseille, 2021 | | 2021 |
| From Alarm System Events Towards Quality Inspection of The Final Product: Application to a Semiconductor Industry M Al-Kharaz, B Ananou, M Ouladsine, M Combal, J Pinaton 2021 European Control Conference (ECC), 1768-1773, 2021 | | 2021 |
