Engineering strained silicon on insulator wafers with the Smart CutTM technology B Ghyselen, JM Hartmann, T Ernst, C Aulnette, B Osternaud, ... Solid-state electronics 48 (8), 1285-1296, 2004 | 160 | 2004 |
Multistep damage evolution process in cubic zirconia irradiated with MeV ions S Moll, L Thomé, G Sattonnay, A Debelle, F Garrido, L Vincent, J Jagielski Journal of Applied Physics 106 (7), 2009 | 95 | 2009 |
In situ TEM study of temperature-induced fission product precipitation in UO2 C Sabathier, L Vincent, P Garcia, F Garrido, G Carlot, L Thome, P Martin, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2008 | 93 | 2008 |
Novel heterostructured Ge nanowires based on polytype transformation L Vincent, G Patriarche, G Hallais, C Renard, C Gardès, D Troadec, ... Nano letters 14 (8), 4828-4836, 2014 | 81 | 2014 |
Xenon versus helium behavior in UO2 single crystals: A TEM investigation G Sattonnay, L Vincent, F Garrido, L Thome Journal of nuclear materials 355 (1-3), 131-135, 2006 | 81 | 2006 |
Structure and magnetic properties of ZnO films doped with Co, Ni or Mn synthesized by pulsed laser deposition under low and high oxygen partial pressures JC Pivin, G Socol, I Mihailescu, P Berthet, F Singh, MK Patel, L Vincent Thin Solid Films 517 (2), 916-922, 2008 | 80 | 2008 |
Damage induced by electronic excitation in ion-irradiated yttria-stabilized zirconia S Moll, L Thomé, L Vincent, F Garrido, G Sattonnay, T Thomé, J Jagielski, ... Journal of Applied Physics 105 (2), 2009 | 68 | 2009 |
Radiation stability of fluorite-type nuclear oxides F Garrido, L Vincent, L Nowicki, G Sattonnay, L Thomé Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2008 | 61 | 2008 |
Reduced pressure chemical vapour deposition of SiGe virtual substrates for high mobility devices JM Hartmann, Y Bogumilowicz, P Holliger, F Laugier, R Truche, ... Semiconductor science and technology 19 (3), 311, 2003 | 58 | 2003 |
Radiation tolerance of fluorite-structured oxides subjected to swift heavy ion irradiation F Garrido, S Moll, G Sattonnay, L Thomé, L Vincent Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2009 | 50 | 2009 |
Crystalline, phononic, and electronic properties of heterostructured polytypic Ge nanowires by Raman spectroscopy C Fasolato, M De Luca, D Djomani, L Vincent, C Renard, G Di Iorio, ... Nano letters 18 (11), 7075-7084, 2018 | 44 | 2018 |
Profile measurements of helium implanted in UO2 sintered pellets by using the 3He (d, α) 1H nuclear reaction analysis technique T Sauvage, H Erramli, S Guilbert, L Vincent, MF Barthe, P Desgardin, ... Journal of Nuclear Materials 327 (2-3), 159-164, 2004 | 43 | 2004 |
Thermal behaviour of helium in silicon carbide: Influence of microstructure L Vincent, T Sauvage, G Carlot, P Garcia, G Martin, MF Barthe, ... Vacuum 83, S36-S39, 2009 | 39 | 2009 |
Shear-driven phase transformation in silicon nanowires L Vincent, D Djomani, M Fakfakh, C Renard, B Belier, D Bouchier, ... Nanotechnology 29 (12), 125601, 2018 | 36 | 2018 |
Accurate estimation of band offsets in group IV polytype junctions: a first-principles study T Kaewmaraya, L Vincent, M Amato The Journal of Physical Chemistry C 121 (10), 5820-5828, 2017 | 35 | 2017 |
He implantation in cubic zirconia: Deleterious effect of thermal annealing G Velisa, A Debelle, L Vincent, L Thomé, A Declémy, D Pantelica Journal of nuclear materials 402 (1), 87-92, 2010 | 27 | 2010 |
Perpendicular magnetization of FePt particles in silica induced by swift heavy ion irradiation JC Pivin, F Singh, O Angelov, L Vincent Journal of Physics D: Applied Physics 42 (2), 025005, 2008 | 26 | 2008 |
Microstructure of Cs-implanted zirconia: Role of temperature L Vincent, L Thomé, F Garrido, O Kaitasov, F Houdelier Journal of Applied Physics 104 (11), 2008 | 26 | 2008 |
XRD contribution to the study of Cs-implanted cubic zirconia A Debelle, A Declémy, L Vincent, F Garrido, L Thomé Journal of nuclear materials 396 (2-3), 240-244, 2010 | 24 | 2010 |
Dislocation and antiphase domain free microscale GaAs crystals grown on SiO2 from (001) Si nano-areas C Renard, N Cherkasin, A Jaffré, L Vincent, A Michel, T Molière, ... Applied Physics Letters 102 (19), 2013 | 23 | 2013 |