| Wafer-Scale Fabrication of Recessed-Channel PtSe2 MOSFETs With Low Contact Resistance and Improved Gate Control L Li, K Xiong, RJ Marsell, A Madjar, NC Strandwitz, JCM Hwang, ... IEEE Transactions on Electron Devices 65 (10), 4102-4108, 2018 | 38 | 2018 |
| Black phosphorus high-frequency transistors with local contact bias C Li, K Xiong, L Li, Q Guo, X Chen, A Madjar, K Watanabe, T Taniguchi, ... ACS nano 14 (2), 2118-2125, 2020 | 24 | 2020 |
| CMOS-compatible batch processing of monolayer MoS2 MOSFETs K Xiong, H Kim, RJ Marstell, A Göritz, C Wipf, L Li, JH Park, X Luo, ... Journal of Physics D: Applied Physics 51 (15), 15LT02, 2018 | 23 | 2018 |
| Large-Scale Fabrication of Submicrometer-Gate-Length MOSFETs With a Trilayer PtSe2 Channel Grown by Molecular Beam Epitaxy K Xiong, M Hilse, L Li, A Göritz, M Lisker, M Wietstruck, M Kaynak, ... IEEE Transactions on Electron Devices 67 (3), 796-801, 2020 | 21 | 2020 |
| Scanning microwave microscopy of buried CMOS interconnect lines with nanometer resolution X Jin, K Xiong, R Marstell, NC Strandwitz, JCM Hwang, M Farina, A Göritz, ... International Journal of Microwave and Wireless Technologies 10 (5-6), 556-561, 2018 | 9 | 2018 |
| Improvement by Channel Recess of Contact Resistance and Gate Control in Large-Scale Spin-Coated MoS2 MOSFETs K Xiong, L Li, RJ Marstell, A Madjar, NC Strandwitz, JCM Hwang, Z Lin, ... IEEE Electron Device Letters 39 (9), 1453-1456, 2018 | 8 | 2018 |
| Continuous-wave and transient characteristics of phosphorene microwave transistors X Luo, K Xiong, JCM Hwang, Y Du, PD Ye 2016 IEEE MTT-S International Microwave Symposium (IMS), 1-3, 2016 | 7 | 2016 |
| Phosphorene FETs—Promising transistors based on a few layers of phosphorus atoms K Xiong, X Luo, JCM Hwang 2015 IEEE MTT-S International Microwave Workshop Series on Advanced …, 2015 | 7 | 2015 |
| Inverted scanning microwave microscopy for nanometer-scale imaging and characterization of platinum diselenide G Fabi, X Jin, JCM Hwang, CH Joseph, E Pavoni, L Li, K Xiong, Y Ning, ... 2019 IEEE MTT-S International Microwave Symposium (IMS), 1115-1117, 2019 | 5 | 2019 |
| Wafer-scale material-device correlation of tellurene MOSFETs K Xiong, L Li, RJ Marstell, A Madjar, NC Strandwitz, JCM Hwang, G Qiu, ... 2018 IEEE MTT-S International Microwave Workshop Series on Advanced …, 2018 | 4 | 2018 |
| Black phosphorus MOSFET for future-generation thin-film electronics capable of microwave operation K Xiong, C Li, L Li, Q Guo, K Watanabe, T Taniguchi, A Madjar, F Xia, ... 2019 IEEE MTT-S International Microwave Symposium (IMS), 1104-1106, 2019 | 3 | 2019 |
| Large-Scale Fabrication of RF MOSFETs on Liquid-Exfoliated MoS2 K Xiong, L Li, A Madjar, JCM Hwang, Z Lin, Y Huang, X Duan, A Göritz, ... 2018 48th European Microwave Conference (EuMC), 1105-1108, 2018 | 3 | 2018 |
| Scanning microwave microscopy of aluminum CMOS interconnect lines buried in oxide and water X Jin, K Xiong, R Marstell, NC Strandwitz, JCM Hwang, M Farina, A Göritz, ... 2017 47th European Microwave Conference (EuMC), 975-977, 2017 | 2 | 2017 |
| Temperature-Dependent RF Characteristics of Al₂O₃-Passivated WSe₂ MOSFETs K Xiong, X Zhang, L Li, F Zhang, B Davis, A Madjar, A Göritz, M Wietstruck, ... IEEE Electron Device Letters 41 (7), 1134-1137, 2020 | 1 | 2020 |
| High-Frequency Tellurene MOSFETs with Biased Contacts K Xiong, G Qiu, Y Wang, L Li, A Göritz, M Lisker, M Wietstruck, M Kaynak, ... 2021 IEEE MTT-S International Microwave Symposium (IMS), 319-322, 2021 | | 2021 |
| Quantitative Scanning Microwave Microscopy of Few-layer Platinum Diselenide X Wang, K Xiong, L Li, JCM Hwang, X Jin, G Fabi, M Farina, O Hartwig, ... 2020 50th European Microwave Conference (EuMC), 987-990, 2021 | | 2021 |
| Design, Fabrication, Characterization and Modeling of CMOS-Compatible PtSe2 MOSFETs K Xiong Lehigh University, 2020 | | 2020 |
| Phosphorene Transistors-a Brief Review K Xiong, X Luo, JCM Hwang Electrochemical Society Meeting Abstracts 229, 1308-1308, 2016 | | 2016 |
Lei LiCornell University在 cornell.edu 的电子邮件经过验证
