关注
Dr. Narendra Yadava
Dr. Narendra Yadava
Assistant Professor, Department of ECE, IET, DDUGU. Ph.D. Department of ECE, MMMUT
在 ddugu.ac.in 的电子邮件经过验证
标题
引用次数
引用次数
年份
Recent Advances in Designing Gallium Oxide MOSFET for RF Application
N Yadava, RK Chauhan
ECS Journal of Solid State Science and Technology 9 (6), 065010, 2020
442020
RF Performance Investigation of β-Ga2O3/Graphene and β-Ga2O3/Black Phosphorus Heterostructure MOSFETs
N Yadava, RK Chauhan
ECS Journal of Solid State Science and Technology 8 (7), Q3058, 2019
322019
Impact of Different Gate Metals on the RF Performance of Gallium Oxide MOSFET
N Yadava, RK Chauhan
ECS Journal of Solid State Science and Technology 9 (5), 055011, 2020
132020
Evaluation of the RF performance of the β-Ga 2 O 3 negative-capacitance field-effect transistor
N Yadava, RK Chauhan
Journal of Computational Electronics 19 (2), 603-612, 2020
92020
Impact of p-Type NiO Pocket and Ultra-Thin Graphene Layer on the RF Performance of β-Ga2O3 MOSFET
N Yadava, S Mani, RK Chauhan
ECS Journal of Solid State Science and Technology 9 (4), 045007, 2020
52020
Analysis of RSNM and WSNM of 6T SRAM cell using ultra thin body FD-SOI MOSFET
VK Mishra, N Yadava, K Nigam, B Bansal, RK Chauhan
Advances in Signal Processing and Communication: Select Proceedings of ICSC …, 2019
52019
Design of one-transistor SRAM cell for low power consumption
N Yadava, VK Mishra, RK Chauhan
2016 International Conference on Emerging Trends in Electrical Electronics …, 2016
52016
RF performance evaluation of p-type NiO-pocket based β-Ga2O3/black phosphorous heterostructure MOSFET
N Yadava, S Mani, RK Chauhan
Journal of Semiconductors 41 (12), 122803, 2020
42020
Improvement of Leakage Current in Double Pocket FDSOI 22 nm Transistor Using Gate Metal Arrangement
A Kannaujiya, N Yadava, MD Gupta, RK Chauhan
VLSI, Microwave and Wireless Technologies: Select Proceedings of ICVMWT 2021 …, 2022
32022
RF Performance Enhancement of Gallium Oxide MOSFET using p-type NiO Pocket near Source and Drain Regions
N Yadava, RK Chauhan
Journal of Telecommunication, Electronic and Computer Engineering (JTEC) 11 …, 2019
32019
Gilbert mixer cell design for RF application using CMOS technology
RK Chauhan
2019 IEEE 5th International Conference for Convergence in Technology (I2CT), 1-6, 2019
32019
Impact of Doping Density on Junctionless Gate Stack FD-SOI MOSFET for Analog/RF Application
J Singh, N Yadava, RK Chauhan
2019 IEEE 5th International Conference for Convergence in Technology (I2CT), 1-4, 2019
32019
Design of UWB CMOS CG-LNA with Improved Noise Figure using Noise Cancellation Technique
N Singh, N Yadava, RK Chauhan
2019 IEEE 5th International Conference for Convergence in Technology (I2CT), 1-4, 2019
32019
Gate Stacked FD-SOI MOS Structure for Better Controllability at High Frequencies
J Singh, N Yadava, RK Chauhan
2018 5th IEEE Uttar Pradesh Section International Conference on Electrical …, 2018
32018
Performance Investigation of Ga2O3 semiconductor based schottky diode for RF application
S Yadav, N Yadava, RK Chauhan
2020 International Conference on Electrical and Electronics Engineering …, 2020
22020
Impact of Drain Engineering on RF Performance of Nano-scale FD-SOI-MOSFET
N Yadava, RK Chauhan
2020 International Conference on Electrical and Electronics Engineering …, 2020
22020
Role of High-k in 32nm FDSOI MOS Transistor for High Frequency Applications
A Pandey, N Yadava, RK Chauhan
2018 5th IEEE Uttar Pradesh Section International Conference on Electrical …, 2018
22018
Analysis of N+N Epi-Source Asymmetric Double Gate FD-SOI MOSFET
N Yadava, VK Mishra, RK Chauhan
Intelligent Engineering Informatics: Proceedings of the 6th International …, 2018
22018
Study the Impact of ZrO2 High-k Dielectrics Gate Material on FD-SOI and PD-SOI MOSFET
A Srivastava, N Yadava, MD Gupta, RK Chauhan
VLSI, Microwave and Wireless Technologies: Select Proceedings of ICVMWT 2021 …, 2022
12022
Impact of Work Function Tunability on Thermal and RF Performance of P-type Window based Junctionless Transistor
P Tripathi, N Yadava, MD Gupta, RK Chauhan
Advances in Electrical and Electronic Engineering 20 (1), 73-85, 2022
12022
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