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hyakka nakada
hyakka nakada
(株)リクルート、慶應義塾大学
在 r.recruit.co.jp 的电子邮件经过验证
标题
引用次数
引用次数
年份
Search device, search method and plasma processing apparatus
T Ohmori, H Nakada, N Kofuji, M Ishikawa, M Kurihara
US Patent 11,189,470, 2021
92021
Retrieval apparatus and retrieval method for semiconductor device processing
T Ohmori, H Nakada, M Ishikawa, M Kurihara
US Patent 10,627,788, 2020
92020
System and method of determining processing condition
H Nakada, T Ohmori, T Usui, M Kurihara
US Patent 11,112,775, 2021
32021
Feature Parameter Design Using Cross-sectional SEM for Machine Learning-based Optimization in Plasma Etching
T Dobashi, H Nakada, Y Okuyama, T Ohmori
Microscopy and Microanalysis 26 (S2), 1162-1163, 2020
22020
Quick design of feasible tensor networks for constrained combinatorial optimization
H Nakada, K Tanahashi, S Tanaka
arXiv preprint arXiv:2409.01699, 2024
12024
Plasma processing apparatus including predictive control
Y Okuyama, T Ohmori, M Kurihara, H Nakada
US Patent 11,907,235, 2024
12024
Search device, searching method, and plasma processing apparatus
Y Okuyama, T Ohmori, M Kurihara, H Nakada
US Patent App. 18/124,112, 2023
12023
Computer, method for determining processing control parameter, substitute sample, measurement system, and measurement method
T Ohmori, H Nakada, M Kurihara, T Usui, N Kofuji
US Patent 11,287,782, 2022
12022
Substitute sample, method for determining control parameter of processing, and measurement system
H Nakada, T Ohmori, T Usui, M Kurihara, N Kofuji
US Patent 11,152,237, 2021
12021
Inductive Construction of Variational Quantum Circuit for Constrained Combinatorial Optimization
H Nakada, K Tanahashi, S Tanaka
arXiv preprint arXiv:2501.03521, 2025
2025
Information processing system and processing condition determination system
H Nakada
US Patent App. 18/287,488, 2024
2024
Computer system and apparatus condition search support method
T Ohmori, Y Okuyama, H Nakada
US Patent App. 18/684,866, 2024
2024
Initialization Method for Factorization Machine Based on Low-Rank Approximation for Constructing a Corrected Approximate Ising Model
Y Seki, H Nakada, S Tanaka
arXiv preprint arXiv:2410.12747, 2024
2024
Contour analysis apparatus, processing condition determination system, shape estimation system, semiconductor device manufacturing system, search apparatus, and data structure …
H Nakada, T Ohmori, N Takano
US Patent 12,094,146, 2024
2024
Additive manufacturing condition search apparatus, additive manufacturing condition search method, and reference sample
H Kawanaka, H Nakada, N Saitou, S Matsushita
US Patent 12,036,609, 2024
2024
Contour line analysis apparatus, processing dimension extraction system, processing condition decision system, semiconductor device manufacturing system, and data structure
N Takano, H Nakada, T Ohmori, Y Okuyama
US Patent App. 17/908,185, 2024
2024
情報提供システムおよび情報提供方法
中田百科, 高橋諒, 下川学理, 中山裕貴, 桑原元芳
JP Patent App. 特開2024-058,737, 2024
2024
制約付き組合せ最適化向けの実行可能テンソルネットワークの機械的構築
中田百科, 棚橋耕太郎, 田中宗
研究報告量子ソフトウェア (QS) 2024 (27), 1-8, 2024
2024
大規模言語モデルチューニングによる非構造ドキュメント画像向け OCR テキスト解析
中田百科, 江上尚志, 福地鈴佳, 久保田茉莉花, 薬師寺政和
人工知能学会全国大会論文集 第 38 回 (2024), 4A1GS601-4A1GS601, 2024
2024
非構造ドキュメント画像向け OCR テキスト解析のための進化計算に基づく自動プロンプトエンジニアリング
江上尚志, 中田百科, 福地鈴佳, 久保田茉莉花, 薬師寺政和
人工知能学会全国大会論文集 第 38 回 (2024), 4N3GS601-4N3GS601, 2024
2024
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