| A neural network approach to smooth calibrated data corrupted from switching errors A Zarate-de Landa, MA Pulido-Gaytan, JA Reynoso-Hernandez, P Roblin, ... Microwave Measurement Symposium (ARFTG), 2012 80th ARFTG, 1-4, 2012 | 58* | 2012 |
| Advances in linear modeling of microwave transistors A Zarate-de Landa, JE Zuniga-Juarez, JR Loo-Yau, ... IEEE Microwave magazine 10 (2), 100, 102-111, 146, 2009 | 46 | 2009 |
| Artificial neural network model of SOS-MOSFETs based on dynamic large-signal measurements Y Ko, P Roblin, A Zarate-De Landa, JA Reynoso-Hernandez, D Nobbe, ... IEEE Transactions on Microwave Theory and Techniques 62 (3), 491-501, 2014 | 39 | 2014 |
| Generalized theory of the thru-reflect-match calibration technique MA Pulido-Gaytán, JA Reynoso-Hernández, JR Loo-Yau, ... IEEE Transactions on Microwave Theory and Techniques 63 (5), 1693-1699, 2015 | 22 | 2015 |
| Using Lines of Arbitrary Impedance as Standards on the TRL Calibration Technique MCMS J.A. Reynoso-Hernández, M. A. Pulido-Gaytán, A The Automatic RF Techniques Group (ARFTG) 81, 2013 | 22 | 2013 |
| A new and better method for extracting the parasitic elements of on-wafer GaN transistors A Zárate-de Landa, JE Zuniga-Juarez, JA Reynoso-Hernández, ... 2007 IEEE/MTT-S International Microwave Symposium, 791-794, 2007 | 22 | 2007 |
| Vector Network Analyzer Calibration Using a Line and Two Offset Reflecting Loads MA Pulido-Gaytan, JA Reynoso-Hernandez, A Zarate-de Landa, ... Microwave Theory and Techniques, IEEE Transactions on 61 (9), 3417 - 3423, 2013 | 14 | 2013 |
| A new method for determining the gate resistance and inductance of GaN HEMTs based on the extrema points of Z11 curves JA Reynoso-Hernández, JE Zuniga-Juarez, A Zarate-de Landa 2008 IEEE MTT-S International Microwave Symposium Digest, 1409-1412, 2008 | 12 | 2008 |
| Modeling the IV curves and its derivatives of microwave transistors using neural networks A Zarate-de Landa, P Roblin, JA Reynoso-Hernandez, JR Loo-Yau IEEE microwave and wireless components letters 22 (9), 468-470, 2012 | 9 | 2012 |
| A new method for determining the characteristic impedance Zc of transmission lines embedded in symmetrical transitions JE Zuniga-Juarez, JA Reynoso-Hernandez, A Zarate-de Landa 2008 71st ARFTG Microwave Measurement Conference, 1-4, 2008 | 9 | 2008 |
| An Investigation on the Modified Cold-FET Method for Determining the Gate Resistance and Inductance of the Packaged GaN and SiC Transistors A Zárate-de Landa, JE Zuñiga, JA Reynoso-Hernández, ... 70th ARFTG Conference Digest, Arizona, 2007 | 9 | 2007 |
| Fast second harmonic injection characterization for efficiency enhancement of RF power amplifiers H Jang, P Roblin, A Zarate-de Landa, JA Reynoso-Hernandez Microwave Measurement Conference, 2013 82nd ARFTG, 1-4, 2013 | 5 | 2013 |
| Determination of the line characteristic impedance using calibration comparison MA Pulido-Gaytán, JA Reynoso-Hermamdez, AZ Landa, JR LooYau, ... 2018 91st ARFTG Microwave Measurement Conference (ARFTG), 1-3, 2018 | 3 | 2018 |
| LZZM: An extension of the theory of the LZZ calibration technique MA Pulido-Gaytan, JA Reynoso-Hernandez, A Zaratede Landa, ... ARFTG Microwave Measurement Conference (ARFTG), 2014 84th, 1-4, 2014 | 2 | 2014 |
| On the Determination of Neural Network Based Non-Linear Constitutive Relations for Quasi-Static GaN FET Models A Zarate-de Landa, JA Reynoso-Hernandez, P Roblin, MA Pulido-Gaytan, ... Microwave Measurement Conference, 2013 82nd ARFTG, 1-4, 2013 | 2 | 2013 |
| On the implementation of the LZZ calibration technique in the S-parameters measurement of devices mounted in test fixtures MA Pulido-Gaytán, JA Reynoso-Hernández, MC Maya-Sánchez, ... 2015 85th Microwave Measurement Conference (ARFTG), 1-5, 2015 | | 2015 |
