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Nimit Jain
Nimit Jain
在 utwente.nl 的电子邮件经过验证
标题
引用次数
引用次数
年份
Low cost dynamic error detection in linearity testing of SAR ADCs
N Jain, N Agarwal, R Thinakaran, R Parekhji
2017 IEEE International Test Conference (ITC), 1-8, 2017
192017
A Dual-Alternating-Slope Digital-to-Time Converter Leveraging Mismatch to Improve Delay Step Size
N Jain, EAM Klumperink, H van Rumpt, B Nauta
IEEE Journal of Solid-State Circuits, 2024
2024
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