Gate oxide degradation of SiC MOSFET in switching conditions R Ouaida, M Berthou, J León, X Perpina, S Oge, P Brosselard, C Joubert IEEE Electron Device Letters 35 (12), 1284-1286, 2014 | 152 | 2014 |
Hybrid protection based on pyroswitch and fuse technologies for DC applications R Ouaida, JF De Palma, G Gonthier Symposium de Genie Electrique, 2016 | 21 | 2016 |
Thermal stability of silicon carbide power JFETs C Buttay, R Ouaida, H Morel, D Bergogne, C Raynaud, F Morel IEEE transactions on Electron Devices 60 (12), 4191-4198, 2013 | 20 | 2013 |
State of art of current and future technologies in current limiting devices R Ouaida, M Berthou, D Tournier, JF Depalma 2015 IEEE First International Conference on DC Microgrids (ICDCM), 175-180, 2015 | 17 | 2015 |
Evolution of electrical performance in new generation of SiC MOSFET for high temperature applications R Ouaida, C Calvez, AS Podlejski, P Brosselard CIPS 2014; 8th International Conference on Integrated Power Electronics …, 2014 | 17 | 2014 |
Evaluation of novel hybrid protection based on pyroswitch and fuse technologies T Sakuraba, R Ouaida, S Chen, T Chailloux 2018 International Power Electronics Conference (IPEC-Niigata 2018-ECCE Asia …, 2018 | 14 | 2018 |
Protective device for an electrical circuit, electrical circuit provided with such a device and method for protecting such an electrical circuit G De Palma, R Ouaida US Patent 10,529,521, 2020 | 13 | 2020 |
Vieillissement et mécanismes de dégradation sur des composants de puissance en carbure de silicium (SIC) pour des applications haute température R Ouaida Université Claude Bernard-Lyon I, 2014 | 12 | 2014 |
SiC Vertical JFET pure diode-less inverter leg R Ouaida, X Fonteneau, F Dubois, D Bergogne, F Morel, H Morel, S Oge 2013 Twenty-Eighth Annual IEEE Applied Power Electronics Conference and …, 2013 | 10 | 2013 |
Investigation of using SiC MOSFET for high temperature applications R Ouaida, M Berthou, P Brosselard, S Oge, P Bevilacqua, C Joubert EPE Journal 25 (2), 5-11, 2015 | 7 | 2015 |
Breaker device for connection to an electrical circuit G Gonthier, F Marlin, JF De Palma, R Ouaida US Patent 10,622,179, 2020 | 5 | 2020 |
Electrical performances and reliability of commercial SiC MOSFETs at high temperature and in SC conditions M Berthou, R Ouaida, T Chailoux, P Brosselard, S Oge, D Tournier Proceedings of the 17th European Conference on Power Electronics and …, 2015 | 4 | 2015 |
Thermal runaway robustness of sic vjfets R Ouaida, C Buttay, A Hoang, R Riva, D Bergogne, H Morel, C Raynaud, ... Materials Science Forum 740, 929-933, 2013 | 4 | 2013 |
Pyrotechnic switching device A Mathieu, R Lorenzon, JF De Palma, R Ouaida US Patent 10,886,088, 2021 | 3 | 2021 |
DC GRIDS: New over current protection R Ouaida, JF de PALMA, G Gonthier 2016 18th European Conference on Power Electronics and Applications (EPE'16 …, 2016 | 3 | 2016 |
New over current protection technology addressing DC Transportation R Ouaida, JF de Palma, G Gonthier 2016 IEEE Transportation Electrification Conference and Expo (ITEC), 1-6, 2016 | 3 | 2016 |
SiC Mosfet for high temperature motor driving Applications S Oge, R Ouaida, P Brosselard, G Peyresoubes PCIM Europe 2014; International Exhibition and Conference for Power …, 2014 | 3 | 2014 |
Hybrid protection based on pyroswitch and fuse technologies for DC transprotation R Ouaida, J Palma, RG Onthie Symposium De Genie Electrique. Grenoble France, 2016 | 2 | 2016 |
Etude sur les transistors MOSFETs en Carbure de Silicium-Potentiel d'utilisation dans les Applications Hautes Températures R Ouaida, P Brosselard, P Bevilacqua Symposium de Génie Electrique (SGE'14), 2014 | 1 | 2014 |
Thermal stability of SiC JFETs in conduction mode R Ouaida, C Buttay, R Riva, D Bergogne, C Raynaud, F Morel, B Allard 2013 15th European Conference on Power Electronics and Applications (EPE), 1-8, 2013 | 1 | 2013 |