Tauc-plot scale and extrapolation effect on bandgap estimation from UV–vis–NIR data–a case study of β-Ga2O3 PR Jubu, FK Yam, VM Igba, KP Beh Journal of Solid State Chemistry 290, 121576, 2020 | 259 | 2020 |
Effects of thermal treatment on the anodic growth of tungsten oxide films Y Chai, CW Tam, KP Beh, FK Yam, Z Hassan Thin Solid Films 588, 44-49, 2015 | 34 | 2015 |
Titanium dioxide nanotubes in chloride based electrolyte: an alternative to fluoride based electrolyte SW Ng, FK Yam, KP Beh, Z Hassan Sains Malays 43, 947-951, 2014 | 27 | 2014 |
Rapid formation and evolution of anodized-Zn nanostructures in NaHCO3 solution CF Mah, KP Beh, FK Yam, Z Hassan ECS Journal of Solid State Science and Technology 5 (10), M105, 2016 | 26 | 2016 |
The growth of III–V nitrides heterostructure on Si substrate by plasma-assisted molecular beam epitaxy KP Beh, FK Yam, CW Chin, SS Tneh, Z Hassan Journal of alloys and compounds 506 (1), 343-346, 2010 | 25 | 2010 |
Porous WO3 formed by anodization in oxalic acid Y Chai, CW Tam, KP Beh, FK Yam, Z Hassan Journal of Porous Materials 20, 997-1002, 2013 | 22 | 2013 |
Photoelectrochemical ultraviolet photodetector by anodic titanium dioxide nanotube layers S Ng, FK Yam, SN Sohimee, KP Beh, SS Tneh, YL Cheong, Z Hassan Sensors and Actuators A: Physical 279, 263-271, 2018 | 21 | 2018 |
Characteristics and sensing of Sol-gel derived titanium dioxide-based ultraviolet photodetector on flame retardant-4 board KT Low, FK Yam, KP Beh, A Abd Manaf, KK Beh Sensors and Actuators A: Physical 323, 112654, 2021 | 16 | 2021 |
Performance evaluation of titanium dioxide based dye-sensitized solar cells under the influence of anodization steps, nanotube length and ionic liquid-free redox electrolyte … YL Cheong, KP Beh, FK Yam, Z Hassan Superlattices and Microstructures 94, 74-84, 2016 | 15 | 2016 |
The influence of growth temperatures on the characteristics of GaN nanowires LL Low, FK Yam, KP Beh, Z Hassan Applied surface science 258 (1), 542-546, 2011 | 15 | 2011 |
The growth of heavily Mg-doped GaN thin film on Si substrate by molecular beam epitaxy CW Chin, FK Yam, KP Beh, Z Hassan, MA Ahmad, Y Yusof, SKM Bakhori Thin Solid Films 520 (2), 756-760, 2011 | 14 | 2011 |
Controlled synthesis of vertically aligned honeycomb TiO2 nanotube arrays: effect of high-temperature annealing on physical properties KM Chahrour, FK Yam, JJ Samuel, R Abdalrheem, KP Beh, HS Lim Applied Physics A 125, 1-9, 2019 | 13 | 2019 |
Photoelectrochemical fabrication of porous GaN and their applications in ultraviolet and ammonia sensing KP Beh, FK Yam, LK Tan, SW Ng, CW Chin, Z Hassan Japanese Journal of Applied Physics 52 (8S), 08JK03, 2013 | 11 | 2013 |
The effects of morphological changes on the vibrational properties of self-organized TiO2 nanotubes FK Yam, KP Beh, SW Ng, Z Hassan Thin solid films 520 (2), 807-812, 2011 | 11 | 2011 |
Atmospheric pressure chemical vapor deposition of indium oxide nanostructured films for photoelectrochemical application TM Aper, FK Yam, KG Saw, KP Beh, KM Chahrour Results in Physics 24, 104187, 2021 | 10 | 2021 |
Fabrication of titanium dioxide nanofibers via anodic oxidation KP Beh, FK Yam, SS Tneh, Z Hassan Applied surface science 257 (10), 4706-4708, 2011 | 10 | 2011 |
Improved conductivity of indium-tin-oxide film through the introduction of intermediate layer SW Ng, FK Yam, KP Beh, SS Tneh, Z Hassan Superlattices and Microstructures 97, 202-211, 2016 | 9 | 2016 |
The influence of Ga source and substrate position on the growth of low dimensional GaN wires by chemical vapour deposition LL Low, FK Yam, KP Beh, Z Hassan Applied surface science 257 (23), 10052-10055, 2011 | 9 | 2011 |
Properties of nitrogen-doped indium oxide films prepared using chemical vapor deposition technique for photoelectrochemical application TM Aper, FK Yam, KP Beh Materials Chemistry and Physics 275, 125244, 2022 | 8 | 2022 |
Improvement in Photodetection Characteristics of Graphene/p-Silicon Heterojunction Photodetector by PMMA/Graphene Cladding Layer R Abdalrheem, FK Yam, AR Ibrahim, HS Lim, KP Beh, AA Ahmed, ... Journal of Electronic Materials 48, 4064-4072, 2019 | 8 | 2019 |