| Interface alloying of ultra-thin sputter-deposited Co2MnSi films as a source of perpendicular magnetic anisotropy A Basha, H Fu, G Levi, G Leitus, A Kovács, C You, A Kohn Journal of Magnetism and Magnetic Materials 489, 165367, 2019 | 18 | 2019 |
| Elastic and inelastic mean free paths for scattering of fast electrons in thin-film oxides A Basha, G Levi, T Amrani, Y Li, G Ankonina, P Shekhter, L Kornblum, ... Ultramicroscopy 240, 113570, 2022 | 6 | 2022 |
| Interfacial contributions to anomalous Hall effect in perpendicular magnetic anisotropic multilayer H Fu, C You, L Ma, N Tian, F Xin, Z Cheng, A Basha, A Kohn Physical Review Materials 2 (12), 124404, 2018 | 6 | 2018 |
| Short-range order in amorphous oxygen-deficient TaOx thin films and its relation to electrical conductivity T Amrani, A Basha, A Azulay, G Levi, A Kohn, I Goldfarb Applied Physics Letters 123 (6), 2023 | 2 | 2023 |
| Evaluating direct detection detectors for short-range order characterization of amorphous materials by electron scattering A Basha, G Levi, L Houben, T Amrani, I Goldfarb, A Kohn Ultramicroscopy 249, 113737, 2023 | 2 | 2023 |
| The Mean Inner Potential of Hematite α-Fe2O3 Across the Morin Transition A Auslender, A Basha, DA Grave, A Rothschild, O Diéguez, A Kohn Microscopy and Microanalysis 29 (3), 919-930, 2023 | 2 | 2023 |
| Enhanced superconductivity in -based interfaces via amorphous capping I Silber, A Azulay, A Basha, D Ketchker, M Baskin, A Yagoda, L Kornblum, ... Physical Review Materials 8 (8), 084803, 2024 | 1 | 2024 |
| The Mean Inner Potential of Hematite- α-Fe2O3 across the Morin Transition A Auslender, A Basha, DA Grave, A Rothschild, O Diéguez, A Kohn Microscopy and Microanalysis 30 (Supplement_1), ozae044. 837, 2024 | | 2024 |
| STEM Energy-Dispersive X-ray Spectroscopy for Quantitative Compositional Metrology in ULSI Technology D Fishman, A Basha, A Azulay, A Kohn Microscopy and Microanalysis 30 (Supplement_1), ozae044. 590, 2024 | | 2024 |
| A Straightforward Method for Measuring the Elastic and Inelastic Mean Free Paths for Scattering of Fast Electrons in Technologically Important Thin-Film Oxides A Basha, G Levi, T Amrani, Y Li, G Ankonina, P Shekhter, L Kornblum, ... Microscopy and Microanalysis 28 (S1), 774-778, 2022 | | 2022 |
| METHODOLOGY FOR MEASURING THE ELASTIC AND INELASTIC MEAN FREE PATHS FOR SCATTERING OF FAST ELECTRONS IN TECHNOLOGICALLY IMPORTANT THIN-FILM OXIDES A Basha, G Levi, Y Li, G Ankonina, P Shekhter, L Kornblum, I Goldfarb, ... | | |
