| Depth‐Resolved X‐Ray Photoelectron Spectroscopy Evidence of Intrinsic Polar States in HfO2‐Based Ferroelectrics MO Hill, JS Kim, ML Müller, D Phuyal, S Taper, M Bansal, MT Becker, ... Advanced Materials 36 (45), 2408572, 2024 | 1 | 2024 |
| Ultra‐Sensitive, Self‐powered, CMOS‐Compatible Near‐Infrared Photodetectors for Wide‐Ranging Applications NE Silva, AR Jayakrishnan, A Kaim, K Gwozdz, L Domingues, JS Kim, ... Advanced Functional Materials, 2416979, 2024 | | 2024 |
