| Introduction to flash memory R Bez, E Camerlenghi, A Modelli, A Visconti Proceedings of the IEEE 91 (4), 489-502, 2003 | 1417 | 2003 |
| Flash memory cells-an overview P Pavan, R Bez, P Olivo, E Zanoni Proceedings of the IEEE 85 (8), 1248-1271, 1997 | 1085 | 1997 |
| Electronic switching in phase-change memories A Pirovano, AL Lacaita, A Benvenuti, F Pellizzer, R Bez IEEE Transactions on Electron Devices 51 (3), 452-459, 2004 | 762 | 2004 |
| Novel/spl mu/trench phase-change memory cell for embedded and stand-alone non-volatile memory applications F Pellizzer, A Pirovano, F Ottogalli, M Magistretti, M Scaravaggi, P Zuliani, ... Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004., 18-19, 2004 | 546 | 2004 |
| Reliability study of phase-change nonvolatile memories A Pirovano, A Redaelli, F Pellizzer, F Ottogalli, M Tosi, D Ielmini, ... IEEE Transactions on Device and Materials Reliability 4 (3), 422-427, 2004 | 507 | 2004 |
| Low-field amorphous state resistance and threshold voltage drift in chalcogenide materials A Pirovano, AL Lacaita, F Pellizzer, SA Kostylev, A Benvenuti, R Bez IEEE Transactions on Electron Devices 51 (5), 714-719, 2004 | 446 | 2004 |
| Electronic switching effect and phase-change transition in chalcogenide materials A Redaelli, A Pirovano, F Pellizzer, AL Lacaita, D Ielmini, R Bez IEEE Electron Device Letters 25 (10), 684-686, 2004 | 365 | 2004 |
| Scaling analysis of phase-change memory technology A Pirovano, AL Lacaita, A Benvenuti, F Pellizzer, S Hudgens, R Bez IEEE International Electron Devices Meeting 2003, 29.6. 1-29.6. 4, 2003 | 352 | 2003 |
| Electrothermal and phase-change dynamics in chalcogenide-based memories AL Lacaita, A Redaelli, D Ielmini, F Pellizzer, A Pirovano, A Benvenuti, ... IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 …, 2004 | 335 | 2004 |
| Non-volatile memory technologies: emerging concepts and new materials R Bez, A Pirovano Materials Science in Semiconductor Processing 7 (4-6), 349-355, 2004 | 313 | 2004 |
| 4-Mb MOSFET-selected phase-change memory experimental chip F Bedeschi, R Bez, C Boffino, E Bonizzoni, E Buda, G Casagrande, ... Proceedings of the 30th European Solid-State Circuits Conference, 207-210, 2004 | 237 | 2004 |
| Sublithographic contact structure, phase change memory cell with optimized heater shape, and manufacturing method thereof G Casagrande, R Bez, F Pellizzer US Patent 6,972,430, 2005 | 201 | 2005 |
| An 8Mb demonstrator for high-density 1.8 V phase-change memories F Bedeschi, C Resta, O Khouri, E Buda, L Costa, M Ferraro, F Pellizzer, ... 2004 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No …, 2004 | 200 | 2004 |
| A 90nm phase change memory technology for stand-alone non-volatile memory applications F Pellizzer, A Benvenuti, B Gleixner, Y Kim, B Johnson, M Magistretti, ... 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers., 122-123, 2006 | 176 | 2006 |
| Magnetic memory cell with plural read transistors K Sin, MR Gibbons, WD Jensen, HC Hiner, XS Shi, R Bez, G Casagrande, ... US Patent 7,012,832, 2006 | 157 | 2006 |
| Method and system for controlling MRAM write current to reduce power consumption K Sin, HC Hiner, XS Shi, WD Jensen, HC Tong, MR Gibbons, R Bez, ... US Patent 7,110,289, 2006 | 153 | 2006 |
| 4-Mb MOSFET-selected/spl mu/trench phase-change memory experimental chip F Bedeschi, R Bez, C Boffino, E Bonizzoni, EC Buda, G Casagrande, ... IEEE journal of solid-state circuits 40 (7), 1557-1565, 2005 | 146 | 2005 |
| A 90nm 4Mb embedded phase-change memory with 1.2 V 12ns read access time and 1MB/s write throughput G De Sandre, L Bettini, A Pirola, L Marmonier, M Pasotti, M Borghi, ... 2010 IEEE International Solid-State Circuits Conference-(ISSCC), 268-269, 2010 | 144 | 2010 |
| Analysis of phase distribution in phase-change nonvolatile memories D Ielmini, AL Lacaita, A Pirovano, F Pellizzer, R Bez IEEE Electron Device Letters 25 (7), 507-509, 2004 | 144 | 2004 |
| Chalcogenide PCM: A memory technology for next decade R Bez 2009 IEEE International Electron Devices Meeting (IEDM), 1-4, 2009 | 138 | 2009 |
