A 5.6 ppm/° C temperature coefficient, 87-dB PSRR, sub-1-V voltage reference in 65-nm CMOS exploiting the zero-temperature-coefficient point J Jiang, W Shu, JS Chang IEEE Journal of Solid-State Circuits 52 (3), 623-633, 2016 | 94 | 2016 |
A 65-nm CMOS low dropout regulator featuring> 60-dB PSRR over 10-MHz frequency range and 100-mA load current range J Jiang, W Shu, JS Chang IEEE Journal of Solid-State Circuits 53 (8), 2331-2342, 2018 | 83 | 2018 |
THD of closed-loop analog PWM class-D amplifiers W Shu, JS Chang IEEE Transactions on Circuits and Systems I: Regular Papers 55 (6), 1769-1777, 2008 | 69 | 2008 |
Power supply noise in analog audio class D amplifiers W Shu, JS Chang IEEE Transactions on Circuits and Systems I: Regular Papers 56 (1), 84-96, 2008 | 43 | 2008 |
A 10-GS/s 4-bit single-core digital-to-analog converter for cognitive ultrawidebands FNU Juanda, W Shu, JS Chang IEEE Transactions on Circuits and Systems II: Express Briefs 64 (1), 16-20, 2016 | 33 | 2016 |
A low-EMI, high-reliability PWM-based dual-phase LED driver for automotive lighting Y Qu, W Shu, JS Chang IEEE Journal of Emerging and Selected Topics in Power Electronics 6 (3 …, 2018 | 30 | 2018 |
A 1-GS/s 11-bit SAR-assisted pipeline ADC with 59-dB SNDR in 65-nm CMOS Q Liu, W Shu, JS Chang IEEE Transactions on Circuits and Systems II: Express Briefs 65 (9), 1164-1168, 2018 | 29 | 2018 |
Modeling and analysis of PSRR in analog PWM class D amplifiers T Ge, JS Chang, W Shu 2006 IEEE International Symposium on Circuits and Systems (ISCAS), 4 pp., 2006 | 27 | 2006 |
IMD of closed-loop filterless class D amplifiers W Shu, JS Chang IEEE Transactions on Circuits and Systems I: Regular Papers 57 (2), 518-527, 2009 | 25 | 2009 |
A low THD analog class D amplifier based on self-oscillating modulation with complete feedback network W Yu, W Shu, JS Chang 2009 IEEE International Symposium on Circuits and Systems (ISCAS), 2729-2732, 2009 | 21 | 2009 |
Low gate-count ultra-small area nano advanced encryption standard (AES) design A Shreedhar, KS Chong, NKZ Lwin, NA Kyaw, L Nalangilli, W Shu, ... 2019 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2019 | 19 | 2019 |
A 400-MS/s 10-b 2-b/Step SAR ADC With 52-dB SNDR and 5.61-mW Power Dissipation in 65-nm CMOS Q Liu, W Shu, JS Chang IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (12 …, 2017 | 19 | 2017 |
PSRR of bridge-tied load PWM class D amps T Ge, JS Chang, W Shu 2008 IEEE International Symposium on Circuits and Systems (ISCAS), 284-287, 2008 | 19 | 2008 |
A Monolithic I2V2-Controlled Dual-Phase LED Matrix Driver for Automotive Adaptive Driving Beam (ADB) Headlighting Y Qu, W Shu, JS Chang 2019 IEEE Custom Integrated Circuits Conference (CICC), 1-4, 2019 | 17 | 2019 |
Total Ionizing Dose (TID) effects on finger transistors in a 65nm CMOS process J Jiang, W Shu, KS Chong, T Lin, NKZ Lwin, JS Chang, J Liu 2016 IEEE international symposium on circuits and systems (ISCAS), 5-8, 2016 | 16 | 2016 |
Fourier series analysis for nonlinearities due to the power supply noise in open-loop class D amplifiers W Shu, JS Chang, T Ge, MT Tan APCCAS 2006-2006 IEEE Asia Pacific Conference on Circuits and Systems, 720-723, 2006 | 14 | 2006 |
Experimental investigation into radiation-hardening-by-design (RHBD) flip-flop designs in a 65nm CMOS process T Lin, KS Chong, W Shu, NKZ Lwin, J Jiang, JS Chang 2016 IEEE International Symposium on Circuits and Systems (ISCAS), 966-969, 2016 | 13 | 2016 |
A novel subthreshold voltage reference featuring 17ppm/° C TC within− 40° C to 125° C and 75dB PSRR J Jiang, W Shu, J Chang, J Liu 2015 IEEE International Symposium on Circuits and Systems (ISCAS), 501-504, 2015 | 13 | 2015 |
Radiation-hardened library cell template and its total ionizing dose (TID) delay characterization in 65nm CMOS process JS Chang, KS Chong, W Shu, T Lin, J Jiang, NKZ Lwin, Y Kang 2014 IEEE 57th International Midwest Symposium on Circuits and Systems …, 2014 | 12 | 2014 |
Fourier series analysis of the nonlinearities in analog closed-loop PWM class D amplifiers W Shu, JS Chang, T Ge, MT Tan 2006 IEEE International Symposium on Circuits and Systems (ISCAS), 4 pp.-1385, 2006 | 12 | 2006 |