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wei shu
wei shu
Senior Research Scientist, Nanyang Technological University
在 ntu.edu.sg 的电子邮件经过验证
标题
引用次数
引用次数
年份
A 5.6 ppm/° C temperature coefficient, 87-dB PSRR, sub-1-V voltage reference in 65-nm CMOS exploiting the zero-temperature-coefficient point
J Jiang, W Shu, JS Chang
IEEE Journal of Solid-State Circuits 52 (3), 623-633, 2016
942016
A 65-nm CMOS low dropout regulator featuring> 60-dB PSRR over 10-MHz frequency range and 100-mA load current range
J Jiang, W Shu, JS Chang
IEEE Journal of Solid-State Circuits 53 (8), 2331-2342, 2018
832018
THD of closed-loop analog PWM class-D amplifiers
W Shu, JS Chang
IEEE Transactions on Circuits and Systems I: Regular Papers 55 (6), 1769-1777, 2008
692008
Power supply noise in analog audio class D amplifiers
W Shu, JS Chang
IEEE Transactions on Circuits and Systems I: Regular Papers 56 (1), 84-96, 2008
432008
A 10-GS/s 4-bit single-core digital-to-analog converter for cognitive ultrawidebands
FNU Juanda, W Shu, JS Chang
IEEE Transactions on Circuits and Systems II: Express Briefs 64 (1), 16-20, 2016
332016
A low-EMI, high-reliability PWM-based dual-phase LED driver for automotive lighting
Y Qu, W Shu, JS Chang
IEEE Journal of Emerging and Selected Topics in Power Electronics 6 (3 …, 2018
302018
A 1-GS/s 11-bit SAR-assisted pipeline ADC with 59-dB SNDR in 65-nm CMOS
Q Liu, W Shu, JS Chang
IEEE Transactions on Circuits and Systems II: Express Briefs 65 (9), 1164-1168, 2018
292018
Modeling and analysis of PSRR in analog PWM class D amplifiers
T Ge, JS Chang, W Shu
2006 IEEE International Symposium on Circuits and Systems (ISCAS), 4 pp., 2006
272006
IMD of closed-loop filterless class D amplifiers
W Shu, JS Chang
IEEE Transactions on Circuits and Systems I: Regular Papers 57 (2), 518-527, 2009
252009
A low THD analog class D amplifier based on self-oscillating modulation with complete feedback network
W Yu, W Shu, JS Chang
2009 IEEE International Symposium on Circuits and Systems (ISCAS), 2729-2732, 2009
212009
Low gate-count ultra-small area nano advanced encryption standard (AES) design
A Shreedhar, KS Chong, NKZ Lwin, NA Kyaw, L Nalangilli, W Shu, ...
2019 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2019
192019
A 400-MS/s 10-b 2-b/Step SAR ADC With 52-dB SNDR and 5.61-mW Power Dissipation in 65-nm CMOS
Q Liu, W Shu, JS Chang
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (12 …, 2017
192017
PSRR of bridge-tied load PWM class D amps
T Ge, JS Chang, W Shu
2008 IEEE International Symposium on Circuits and Systems (ISCAS), 284-287, 2008
192008
A Monolithic I2V2-Controlled Dual-Phase LED Matrix Driver for Automotive Adaptive Driving Beam (ADB) Headlighting
Y Qu, W Shu, JS Chang
2019 IEEE Custom Integrated Circuits Conference (CICC), 1-4, 2019
172019
Total Ionizing Dose (TID) effects on finger transistors in a 65nm CMOS process
J Jiang, W Shu, KS Chong, T Lin, NKZ Lwin, JS Chang, J Liu
2016 IEEE international symposium on circuits and systems (ISCAS), 5-8, 2016
162016
Fourier series analysis for nonlinearities due to the power supply noise in open-loop class D amplifiers
W Shu, JS Chang, T Ge, MT Tan
APCCAS 2006-2006 IEEE Asia Pacific Conference on Circuits and Systems, 720-723, 2006
142006
Experimental investigation into radiation-hardening-by-design (RHBD) flip-flop designs in a 65nm CMOS process
T Lin, KS Chong, W Shu, NKZ Lwin, J Jiang, JS Chang
2016 IEEE International Symposium on Circuits and Systems (ISCAS), 966-969, 2016
132016
A novel subthreshold voltage reference featuring 17ppm/° C TC within− 40° C to 125° C and 75dB PSRR
J Jiang, W Shu, J Chang, J Liu
2015 IEEE International Symposium on Circuits and Systems (ISCAS), 501-504, 2015
132015
Radiation-hardened library cell template and its total ionizing dose (TID) delay characterization in 65nm CMOS process
JS Chang, KS Chong, W Shu, T Lin, J Jiang, NKZ Lwin, Y Kang
2014 IEEE 57th International Midwest Symposium on Circuits and Systems …, 2014
122014
Fourier series analysis of the nonlinearities in analog closed-loop PWM class D amplifiers
W Shu, JS Chang, T Ge, MT Tan
2006 IEEE International Symposium on Circuits and Systems (ISCAS), 4 pp.-1385, 2006
122006
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