| Improved morphology and charge carrier injection in pentacene field-effect transistors with thiol-treated electrodes C Bock, DV Pham, U Kunze, D Käfer, G Witte, C Wöll Journal of Applied Physics 100 (11), 2006 | 201 | 2006 |
| Nanolithography with an atomic force microscope by means of vector-scan controlled dynamic plowing B Klehn, U Kunze Journal of applied physics 85 (7), 3897-3903, 1999 | 158 | 1999 |
| Magnetostatic interactions on a square lattice A Remhof, A Schumann, A Westphalen, H Zabel, N Mikuszeit, ... Physical Review B—Condensed Matter and Materials Physics 77 (13), 134409, 2008 | 100 | 2008 |
| Plowing on the Sub‐50nm Scale: Nanolithography Using Scanning Force Microscopy U Kunze, B Klehn Advanced Materials 11 (17), 1473-1475, 1999 | 72 | 1999 |
| Energy spectroscopy of controlled coupled quantum-wire states SF Fischer, G Apetrii, U Kunze, D Schuh, G Abstreiter Nature Physics 2 (2), 91-96, 2006 | 67 | 2006 |
| Invited review nanoscale devices fabricated by dynamic ploughing with an atomic force microscope U Kunze Superlattices and microstructures 31 (1), 3-17, 2002 | 65 | 2002 |
| Size distribution of coherently strained InAs quantum dots KH Schmidt, G Medeiros-Ribeiro, U Kunze, G Abstreiter, M Hagn, ... Journal of applied physics 84 (8), 4268-4272, 1998 | 59 | 1998 |
| Atomic Layer Deposition of Gd2O3 and Dy2O3: A Study of the ALD Characteristics and Structural and Electrical Properties K Xu, R Ranjith, A Laha, H Parala, AP Milanov, RA Fischer, E Bugiel, ... Chemistry of Materials 24 (4), 651-658, 2012 | 56 | 2012 |
| Stabilization of amide-based complexes of niobium and tantalum using malonates as chelating ligands: Precursor chemistry and thin film deposition M Hellwig, A Milanov, D Barreca, JL Deborde, R Thomas, M Winter, ... Chemistry of Materials 19 (25), 6077-6087, 2007 | 56 | 2007 |
| Nanoscale devices fabricated by direct machining of GaAs with an atomic force microscope M Versen, B Klehn, U Kunze, D Reuter, AD Wieck Ultramicroscopy 82 (1-4), 159-163, 2000 | 55 | 2000 |
| Electron transport through a single InAs quantum dot KH Schmidt, M Versen, U Kunze, D Reuter, AD Wieck Physical Review B 62 (23), 15879, 2000 | 52 | 2000 |
| Lanthanide oxide thin films by metalorganic chemical vapor deposition employing volatile guanidinate precursors AP Milanov, T Toader, H Parala, D Barreca, A Gasparotto, C Bock, ... Chemistry of Materials 21 (22), 5443-5455, 2009 | 51 | 2009 |
| Influence of anthracene-2-thiol treatment on the device parameters of pentacene bottom-contact transistors C Bock, DV Pham, U Kunze, D Käfer, G Witte, A Terfort Applied Physics Letters 91 (5), 2007 | 50 | 2007 |
| Low-temperature ballistic transport in nanoscale epitaxial graphene cross junctions S Weingart, C Bock, U Kunze, F Speck, T Seyller, L Ley Applied Physics Letters 95 (26), 2009 | 47 | 2009 |
| Tunnel spectroscopy of electron sub-bands on Si surfaces U Kunze Journal of Physics C: Solid State Physics 17 (31), 5677, 1984 | 46 | 1984 |
| Preparation of electron waveguide devices on GaAs/AlGaAs using negative-tone resist calixarene M Knop, M Richter, R Maßmann, U Wieser, U Kunze, D Reuter, ... Semiconductor science and technology 20 (8), 814, 2005 | 45 | 2005 |
| Magnetization reversal of microstructured kagome lattices A Westphalen, A Schumann, A Remhof, H Zabel, M Karolak, B Baxevanis, ... Physical Review B—Condensed Matter and Materials Physics 77 (17), 174407, 2008 | 44 | 2008 |
| Ballistic rectification in an asymmetric mesoscopic cross junction M Knop, U Wieser, U Kunze, D Reuter, AD Wieck Applied physics letters 88 (8), 2006 | 40 | 2006 |
| Fabrication of a quantum point contact by the dynamic plowing technique and wet-chemical etching S Skaberna, M Versen, B Klehn, U Kunze, D Reuter, AD Wieck Ultramicroscopy 82 (1-4), 153-157, 2000 | 40 | 2000 |
| High-quality solution-processed silicon oxide gate dielectric applied on indium oxide based thin-film transistors F Jaehnike, DV Pham, R Anselmann, C Bock, U Kunze ACS applied materials & interfaces 7 (25), 14011-14017, 2015 | 39 | 2015 |
Andreas Dirk WieckProfessor für Physik, Ruhr-Universität Bochum在 rub.de 的电子邮件经过验证
