| Electronic properties of rhombohedrally stacked bilayer obtained by chemical vapor deposition A Mahmoudi, M Bouaziz, A Chiout, G Di Berardino, N Ullberg, G Kremer, ... Physical Review B 108 (4), 045417, 2023 | 9 | 2023 |
| Backside Absorbing Layer Microscopy: a New Tool to Study the Optical, Chemical and Electrochemical Properties of 2D Materials K Jaouen, F Lebon, B Jousselme, S Campidelli, R Cornut, V Derycke ECS Meeting Abstracts, 742, 2020 | 3 | 2020 |
| Characterizing the low doping regime and charge fluctuation in graphene using Raman spectroscopy. Z Chen, NJC Ullberg, D Barton, A Swan APS March Meeting Abstracts 2019, L55. 007, 2019 | 3 | 2019 |
| A simple KPFM-based approach for electrostatic-free topographic measurements: the case of MoS2 on SiO2 A Arrighi, N Ullberg, V Derycke, B Grévin Nanotechnology 34 (21), 215705, 2023 | 2 | 2023 |
| Monitoring the low doping regime in graphene using Raman 2D peak-splits: Comparison of gated Raman and transport measurements Z Chen, N Ullberg, M Vutukuru, D Barton, AK Swan arXiv preprint arXiv:1908.10961, 2019 | 2 | 2019 |
| Ultra-low doping and local charge variation in graphene measured by Raman: experiment and simulation Z Chen, N Ullberg, M Vutukuru, D Barton, AK Swan arXiv preprint arXiv:2005.04218, 2020 | 1 | 2020 |
| In Operando Study of Charge Modulation in MoS2 Transistors by Excitonic Reflection Microscopy N Ullberg, A Filoramo, S Campidelli, V Derycke ACS nano 18 (14), 9886-9894, 2024 | | 2024 |
| Visibility and charge density imaging of 2-dimensional semiconductors and devices studied using optical microscopy techniques IRM and BALM N Ullberg Université Paris-Saclay, 2023 | | 2023 |
| Imaging charge modulation in operating 2D MoS2 devices by excitonic reflection microscopy N Ullberg | | 2023 |
| Inverted optical reflection microscopy to study visibility and local charge modulation in electrolyte-gated monolayer MoS2 N Ullberg, Q Cogoni, S Campidelli, A Filoramo, V Derycke Graphene 2021-The 11th edition of European Conference and Exhibition in …, 2021 | | 2021 |
| Backside Absorbing Layer Microscopy: A New Tool to Study the Optical, Chemical and Electrochemical Properties of 2D Materials K Jaouen, N Ullberg, F Lebon, B Jousselme, S Campidelli, R Cornut, ... ECS Meeting Abstracts, 596, 2021 | | 2021 |
| Characterizing optical and electrical properties of monolayer MoS2 by backside absorbing layer microscopy N Ullberg | | 2020 |
| Field-effect transistor based biosensing of glucose using carbon nanotubes and monolayer MoS2 N Ullberg | | 2019 |
| Compensation des artefacts topographiques en KPFM: 20 ans après B Grévin, N Ullberg, V Derycke | | |
