| Single event upsets under 14-MeV neutrons in a 28-nm SRAM-based FPGA in static mode JC Fabero, H Mecha, FJ Franco, JA Clemente, G Korkian, S Rey, ... IEEE Transactions on Nuclear Science 67 (7), 1461-1469, 2020 | 25 | 2020 |
| Inherent uncertainty in the determination of multiple event cross sections in radiation tests FJ Franco, JA Clemente, G Korkian, JC Fabero, H Mecha, R Velazco IEEE Transactions on Nuclear Science 67 (7), 1547-1554, 2020 | 16 | 2020 |
| Experimental and analytical study of the responses of nanoscale devices to neutrons impinging at various incident angles G Korkian, JC Fabero, G Hubert, M Rezaei, H Mecha, FJ Franco, ... IEEE Transactions on Nuclear Science 67 (11), 2345-2352, 2020 | 11 | 2020 |
| Single event upsets under proton, thermal, and fast neutron irradiation in emerging nonvolatile memories G Korkian, D León, FJ Franco, JC Fabero, M Letiche, Y Morilla, ... IEEE Access 10, 114566-114585, 2022 | 6 | 2022 |
| Thermal neutron-induced SEUs on a COTS 28-nm SRAM-based FPGA under different incident angles JC Fabero, G Korkian, FJ Franco, H Mecha, M Letiche, JA Clemente 2021 IEEE 22nd Latin American Test Symposium (LATS), 1-6, 2021 | 6 | 2021 |
| SEE sensitivity of a COTS 28-nm SRAM-based FPGA under thermal neutrons and different incident angles JC Fabero, G Korkian, FJ Franco, G Hubert, H Mecha, M Letiche, ... Microprocessors and Microsystems 96, 104743, 2023 | 4 | 2023 |
| Exploration of ring oscillator based temperature sensors network accuracy on FPGA G Korkian, N Rahmanikia, H Noori, JA Clemente 2017 19th International Symposium on Computer Architecture and Digital …, 2017 | 1 | 2017 |
| Analysis of the effects of natural radiation on Commercial-Off-The-Shelf (COTS) memories G Korkian Universidad Complutense de Madrid, 2024 | | 2024 |
| SEE sensitivity of a COTS 28-nm SRAM-based FPGA under thermal neutrons and different incident angles JC Fabero Jiménez, G Korkian, FJ Franco, G Hubert, H Mecha López, ... Elsevier, 2023 | | 2023 |
| FACULTAD DE INFORMÁTICA G Korkian UNIVERSIDAD COMPLUTENSE DE MADRID, 2023 | | 2023 |
| Single Event Upsets under 14-MeV Neutrons in a 28-nm SRAM-based FPGA in Static Mode JC Fabero Jiménez, H Mecha López, FJ Franco Peláez, ... IEEE-Inst Electrical Electronics Engineers Inc, 2020 | | 2020 |
| Inherent Uncertainty in the Determination of Multiple Event Cross Sections in Radiation Tests FJ Franco Peláez, JA Clemente Barreira, G Korkian, JC Fabero Jiménez, ... IEEE-Inst Electrical Electronics Engineers Inc, 2020 | | 2020 |
| Evaluación de los efectos de los neutrones térmicos a diferentes ángulos de incidencia en una FPGA COTS de 28-nm JC Fabero, G Korkian, FJ Franco, H Mecha, JA Clemente | | |
| A Special Total-Ionizing-Dose-Induced Short Channel Effect in Thin-Film PDSOI Technology: Phenomena, Analyses, and Models................................................. D. Bi … G Korkian, JC Fabero, G Hubert, M Rezaei, H Mecha, FJ Franco, ... | | |
Juan Antonio ClementeUniversidad Complutense de Madrid在 fdi.ucm.es 的电子邮件经过验证
