关注
Pieter-Jan Vanthienen
Pieter-Jan Vanthienen
在 uantwerpen.be 的电子邮件经过验证
标题
引用次数
引用次数
年份
Alternative grating designs for cone-beam edge illumination x-ray phase contrast imaging
PJ Vanthienen, J Sanctorum, B Huyge, N Six, J Sijbers, J De Beenhouwer
Developments in X-Ray Tomography XIV 12242, 202-207, 2022
22022
Grating designs for cone beam edge illumination X-ray phase contrast imaging: a simulation study
PJ Vanthienen, J Sanctorum, B Huyge, N Six, J Sijbers, J De Beenhouwer
Optics Express 31 (17), 28051-28064, 2023
12023
Adapting an XCT-scanner to enable edge illumination x-ray phase contrast imaging
B Huyge, PJ Vanthienen, N Six, J Sijbers, J De Beenhouwer
Online e-journal of nondestructive testing.-- 28 (3), 1-7, 2023
12023
系统目前无法执行此操作,请稍后再试。
文章 1–3