Molecular mechanistic origin of the toughness of natural adhesives, fibres and composites BL Smith, TE Schäffer, M Viani, JB Thompson, NA Frederick, J Kindt, ... Nature 399 (6738), 761-763, 1999 | 1427 | 1999 |
Small cantilevers for force spectroscopy of single molecules MB Viani, TE Schäffer, A Chand, M Rief, HE Gaub, PK Hansma Journal of Applied Physics 86 (4), 2258-2262, 1999 | 511 | 1999 |
Probing protein–protein interactions in real time MB Viani, LI Pietrasanta, JB Thompson, A Chand, IC Gebeshuber, ... nature structural biology 7 (8), 644-647, 2000 | 381 | 2000 |
Fast imaging and fast force spectroscopy of single biopolymers with a new atomic force microscope designed for small cantilevers MB Viani, TE Schäffer, GT Paloczi, LI Pietrasanta, BL Smith, JB Thompson, ... Review of Scientific Instruments 70 (11), 4300-4303, 1999 | 341 | 1999 |
Finite optical spot size and position corrections in thermal spring constant calibration R Proksch, TE Schäffer, JP Cleveland, RC Callahan, MB Viani Nanotechnology 15 (9), 1344, 2004 | 292 | 2004 |
Microfabricated small metal cantilevers with silicon tip for atomic force microscopy A Chand, MB Viani, TE Schaffer, PK Hansma Journal of microelectromechanical systems 9 (1), 112-116, 2000 | 89 | 2000 |
Microfabrication of cantilevers using sacrificial templates MB Viani, P Hansma, A Chand, MA Wendman, HJ Morrett US Patent 6,016,693, 2000 | 76 | 2000 |
Practical loss tangent imaging with amplitude-modulated atomic force microscopy R Proksch, M Kocun, D Hurley, M Viani, A Labuda, W Meinhold, J Bemis Journal of Applied Physics 119 (13), 2016 | 58 | 2016 |
Atomic force microscope for small cantilevers TE Schäffer, M Viani, DA Walters, B Drake, EK Runge, JP Cleveland, ... Micromachining and Imaging 3009, 48-52, 1997 | 54 | 1997 |
Photothermal excitation for improved cantilever drive performance in tapping mode atomic force microscopy A Labuda, J Cleveland, NA Geisse, M Kocun, B Ohler, R Proksch, ... Microscopy and analysis, 21-25, 2014 | 48 | 2014 |
Atomic force microscopy using small cantilevers DA Walters, M Viani, GT Paloczi, TE Schaeffer, JP Cleveland, ... Micromachining and Imaging 3009, 43-47, 1997 | 45 | 1997 |
Atomic force microscope detector drift compensation by correlation of similar traces acquired at different setpoints JH Kindt, JB Thompson, MB Viani, PK Hansma Review of scientific instruments 73 (6), 2305-2307, 2002 | 36 | 2002 |
Recent highlights from atomic force microscopy of DNA HG Hansma, LI Pietrasanta, R Golan, JC Sitko, MB Viani, GT Paloczi, ... Journal of Biomolecular Structure and Dynamics 17 (sup1), 271-275, 2000 | 31 | 2000 |
Modular atomic force microscope R Proksch, M Viani, J Cleveland, M Rutgers, M Klonowski, D Walters, ... US Patent 8,370,960, 2013 | 24 | 2013 |
Methods for biological probe microscopy in aqueous fluids JH Kindt, JC Sitko, LI Pietrasanta, E Oroudjev, N Becker, MB Viani, ... Methods Cell Biol 68, 213-229, 2002 | 20 | 2002 |
Fully digital controller for cantilever-based instruments R Proksch, J Cleveland, D Bocek, T Day, M Viani, C Callahan US Patent 7,234,342, 2007 | 17 | 2007 |
Array detector for the atomic force microscope TE Schäffer, M Richter, MB Viani Applied Physics Letters 76 (24), 3644-3646, 2000 | 17 | 2000 |
Exploring flatland: AFM of mechanical and electrical properties of graphene, MoS2 and other low-dimensional materials S Bertolazzi, J Brivio, A Radenovic, A Kis, H Wilson, L Prisbrey, E Minot, ... Microscopy and Analysis 27 (3), 2013 | 15 | 2013 |
Fully digitally controller for cantilever-based instruments R Proksch, J Cleveland, D Bocek, T Day, MB Viani, C Callahan US Patent 7,937,991, 2011 | 10* | 2011 |
Modular atomic force microscope with environmental controls M Viani, R Proksch, M Rutgers, J Cleveland, J Hodgson US Patent 9,097,737, 2015 | 4 | 2015 |