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Xavier Theillier
Xavier Theillier
Karthala System
在 karthalasystem.com 的电子邮件经过验证
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Swept-wavelength null polarimeter for high-speed weak anisotropy measurements
X Theillier, S Rivet, M Dubreuil, YL Grand
Optics Express 30 (11), 18889-18902, 2022
42022
Systematic errors in a swept-wavelength null polarimeter for weak linear retardance measurements
X Theillier, S Rivet, M Dubreuil, Y Le Grand
Applied optics 62 (28), 7529-7535, 2023
32023
An optimization approach of computer generated hologram (CGH) for divergent light shaping
Q Song, YE Pigeon, X Theillier, K Heggarty
Digital Holography and Three-Dimensional Imaging, Tu4A. 5, 2019
32019
Swept-wavelength null polarimetry for highly sensitive birefringence laser scanning microscopy
X Theillier, S Rivet, M Dubreuil, Y Le Grand
Optics Letters 49 (2), 387-390, 2024
22024
Device for polarimetrically characterising the anisotropy of a medium, and corresponding imaging system
Y Le Grand, S Rivet, M Dubreuil, X Theillier
US Patent App. 18/005,740, 2023
2023
Polarimétrie sur fond noir par codage spectral de la polarisation: application à la microscopie à balayage laser
X Theillier
Université de Bretagne occidentale-Brest, 2022
2022
Swept-wavelength null polarimetry for weak linear birefringence imaging
X Theillier, S Rivet, M Dubreuil, Y Le Grand
Unconventional Optical Imaging III 12136, 127-131, 2022
2022
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