| Investigation of Microwave Loss Induced by Oxide Regrowth in High-Q Niobium Resonators J Verjauw, A Potočnik, M Mongillo, R Acharya, F Mohiyaddin, G Simion, ... Physical Review Applied 16 (1), 014018, 2021 | 79 | 2021 |
| Pentacopper (II) complexes of α-aminohydroxamic acids: uranyl-induced conversion of a 12-metallacrown-4 to a 15-metallacrown-5 TN Parac-Vogt, A Pacco, C Görller-Walrand, K Binnemans Journal of inorganic biochemistry 99 (2), 497-504, 2005 | 59 | 2005 |
| Relaxometric Study of Copper [15] Metallacrown‐5 Gadolinium Complexes Derived from α‐Aminohydroxamic Acids TN Parac‐Vogt, A Pacco, P Nockemann, S Laurent, RN Muller, ... Chemistry–A European Journal 12 (1), 204-210, 2006 | 49 | 2006 |
| Nanoparticle removal with megasonics: a review S Brems, M Hauptmann, E Camerotto, A Pacco, TG Kim, X Xu, K Wostyn, ... ECS Journal of Solid State Science and Technology 3 (1), N3010, 2013 | 45 | 2013 |
| Selective wet etching of silicon germanium in composite vertical nanowires Z Baraissov, A Pacco, S Koneti, G Bisht, F Panciera, F Holsteyns, ... ACS applied materials & interfaces 11 (40), 36839-36846, 2019 | 29 | 2019 |
| Non-destructive characterization of extended crystalline defects in confined semiconductor device structures A Schulze, L Strakos, T Vystavel, R Loo, A Pacco, N Collaert, ... Nanoscale 10 (15), 7058-7066, 2018 | 27 | 2018 |
| Influence of surface tension on cavitation noise spectra and particle removal efficiency in high frequency ultrasound fields E Camerotto, S Brems, M Hauptmann, A Pacco, H Struyf, PW Mertens, ... Journal of Applied Physics 112 (11), 2012 | 26 | 2012 |
| Low temperature pre-epi treatment: critical parameters to control interface contamination R Loo, A Hikavyy, FE Leys, M Wada, K Sano, B De Vos, A Pacco, ... Solid state phenomena 145, 177-180, 2009 | 26 | 2009 |
| Controlled cobalt recess for advanced interconnect metallization A Pacco, Y Akanishi, QT Le, E Kesters, G Murdoch, F Holsteyns Microelectronic Engineering 217, 111131, 2019 | 25 | 2019 |
| Mandelohydroxamic Acid as Ligand for Copper(II) 15‐Metallacrown‐5 Lanthanide(III) and Copper(II) 15‐Metallacrown‐5 Uranyl Complexes TN Parac‐Vogt, A Pacco, P Nockemann, YF Yuan, C Görller‐Walrand, ... European journal of inorganic chemistry 2006 (7), 1466-1474, 2006 | 25 | 2006 |
| Lanthanide(III)‐Induced Conversion of 12‐Metallacrown‐4 to 5‐Metallacrown‐5 Complexes in Solution A Pacco, TN Parac‐Vogt, E van Besien, K Pierloot, C Görller‐Walrand, ... European journal of inorganic chemistry 2005 (16), 3303-3310, 2005 | 25 | 2005 |
| The influence of dissolved carbon dioxide on cavitation intensity in ultrasound cleaning systems S Brems, M Hauptmann, E Camerotto, A Pacco, H Struyf, P Mertens, ... Japanese journal of applied physics 52 (6R), 066602, 2013 | 20 | 2013 |
| Buried power rail metal exploration towards the 1 nm node A Gupta, D Radisic, JW Maes, OV Pedreira, JP Soulié, N Jourdan, ... 2021 IEEE International Electron Devices Meeting (IEDM), 22.5. 1-22.5. 4, 2021 | 14 | 2021 |
| Effects of interfacial strength and dimension of structures on physical cleaning window TG Kim, A Pacco, K Wostyn, S Brems, XM Xu, H Struyf, K Arstila, ... Solid State Phenomena 187, 123-126, 2012 | 13 | 2012 |
| Copper (II) 15-metallacrown-5 lanthanide (III) complexes derived from l-serine and l-threonine hydroxamic acids A Pacco, G Absillis, K Binnemans, TN Parac-Vogt Journal of alloys and compounds 451 (1-2), 38-41, 2008 | 12 | 2008 |
| Drying of high aspect ratio structures: a comparison of drying techniques via electrical stiction analysis A Pacco, M Wada, T Bearda, PW Mertens Solid State Phenomena 145, 87-90, 2009 | 10 | 2009 |
| Fabrication and room temperature characterization of trilayer junctions for the development of superconducting qubits on 300 mm wafers D Wan, S Couet, X Piao, L Souriau, Y Canvel, D Tsvetanova, ... Japanese Journal of Applied Physics 60 (SB), SBBI04, 2021 | 9 | 2021 |
| Manufacturing high-Q superconducting {\alpha}-tantalum resonators on silicon wafers DP Lozano, M Mongillo, X Piao, S Couet, D Wan, Y Canvel, AM Vadiraj, ... arXiv preprint arXiv:2211.16437, 2022 | 8 | 2022 |
| Controlling the wet-etch directionality in nanostructured silicon Z Aabdin, T Ghosh, A Pacco, S Raj, HTB Do, K Saidov, TW Weei, ... ACS Applied Electronic Materials 4 (11), 5191-5198, 2022 | 8 | 2022 |
| Towards reduced impact of EUV mask defectivity on wafer R Jonckheere, D Van den Heuvel, A Pacco, I Pollentier, B Baudemprez, ... Photomask and Next-Generation Lithography Mask Technology XXI 9256, 167-174, 2014 | 8 | 2014 |
