| Memory built-in self-repair using redundant words V Schober, S Paul, O Picot Proceedings International Test Conference 2001 (Cat. No. 01CH37260), 995-1001, 2001 | 138 | 2001 |
| Circuit device having a fuse M Di Ronza, O Picot, V Schöber US Patent 6,757,204, 2004 | 33 | 2004 |
| An asynchronous scan path concept for micropipelines using the bundled data convention V Schober, T Kiel Proceedings International Test Conference 1996. Test and Design Validity …, 1996 | 32 | 1996 |
| Integrated memory and method for testing an integrated memory M Di Ronza, Y Martelloni, V Schöber US Patent 7,237,153, 2007 | 13 | 2007 |
| Testable read-only memory for data memory redundant logic L Gaziello, K Oberländer, S Paul, V Schöber, S Randhawa, P Ienne, ... US Patent 6,536,003, 2003 | 12 | 2003 |
| Circuit cell having a built-in self-test function, and test method therefor V Schöber US Patent 6,662,326, 2003 | 6 | 2003 |
| Data memory with short memory access time S Paul, V Schöber US Patent 6,785,170, 2004 | 5 | 2004 |
| An Asynchronous Scan Path for Micropipelined Modules V Schöber, T Kiel Europaen Conference on Design Automation, Paris, France, Proceedings, 28.2-3.3, 1996 | 5 | 1996 |
| Circuit cell for test pattern generation and test pattern compression V Schoeber US Patent 6,912,681, 2005 | 4 | 2005 |
| Der testfreundliche Entwurf asynchroner Schaltungen V Schöber Hannover: Universität, 2001 | 4 | 2001 |
| System for testing digital components R Arnold, M Heinitz, S Köppe, V Schöber US Patent 7,386,776, 2008 | 3 | 2008 |
| Memory built-in self-repair V Schober, O Picot Infineon Technologies, www. item. uni-bremen. de/itg-fg5/workshop-13/papers …, 2005 | 2 | 2005 |
| Testen von Multichip Modulen H Heinitz, F Sporleder, V Schöber, M Ohletz, IU Jorczyk VDI/VDE GMM-Fachbericht Leiterplatte 97, 347, 1997 | 1 | 1997 |
| Transformation der Energiesysteme: Ein kompakter Überblick zur Energieforschung an der Leibniz Universität Hannover R Hanke-Rauschenbach, V Schöber Unimagazin 3/4 (2022) 3, 4-5, 2022 | | 2022 |
| ROBUST: Entwurf Robuster Nanoelektronischer Systeme M Barke, L Hedrich, D Helms, W Lu, M Olbrich, M Radetzki, B Sander, ... newsletter edacentrum, 2010 | | 2010 |
| COMMITTEE date executive committee N Wehn, R Ernst, B Al-Hashimi, Y Zorian, C Heer, M Coppola, ... | | 2009 |
| SAMS-Struktursynthesen von analogen Schaltungen V Schöber, C Grimm, R Jancke, L Hedrich, S Huss newsletter edacentrum 1 (1), 17-20, 2007 | | 2007 |
| DATE 2005 Executive Committee N Wehn, L Benini, G Gielen, D Sciuto, R Lauwereins, J Figueras, ... | | 2005 |
| Bus signal hold cell, bus system, and method O Caty, V Schöber US Patent 6,791,357, 2004 | | 2004 |
| COMMITTEE date executive committee E Macii, L Fanucci, P Girard, D Sciuto, P Marchal, P Cheung, G Fettweis, ... | | |
