| Enabling focused ion beam sample preparation for application in reverse tip sample scanning probe microscopy P Lagrain, K Paulussen, E Grieten, G Van den Bosch, S Rachidi, ... Micro and Nano Engineering 23, 100247, 2024 | | 2024 |
| Method for Producing a Substrate Comprising Multiple Tips for Scanning Probe Microscopy T Hantschel, XM Xu US Patent App. 18/524,772, 2024 | | 2024 |
| Probe chip nanofabrication enabled reverse tip sample scanning probe microscopy concept and measurements HS Kim, N Peric, A Minj, L Wouters, J Serron, C Mancini, S Koylan, ... Nanotechnology 35 (26), 265703, 2024 | | 2024 |
| Wafer configured to recondition a support surface of a wafer holding stage T Hantschel US Patent 11,955,368, 2024 | | 2024 |
| Direct Assessment of Defective Regions in Monolayer MoS2 Field-Effect Transistors through In Situ Scanning Probe Microscopy Measurements A Minj, V Mootheri, S Banerjee, A Nalin Mehta, J Serron, T Hantschel, ... ACS nano 18 (15), 10653-10666, 2024 | | 2024 |
| Design, Fabrication and Evaluation of Diamond Tip Chips for Reverse Tip Sample Scanning Probe Microscope Applications S Gim, T Hantschel, JH Kim Korean Journal of Materials Research 34 (2), 105-110, 2024 | | 2024 |
| An Innovative Multi-Probe Tomographic Atomic Force Microscope for Materials Research and Failure Analysis D Sharma, M Tedaldi, P Hole, ADL Humphris, L Wouters, T Hantschel, ... EDFA Technical Articles 25 (4), 20-26, 2023 | 1 | 2023 |
| Scanning tunneling microscopy for imaging and quantification of defects in as-deposited MoS2 monolayers on sapphire substrates Y Rybalchenko, A Minj, H Medina, R Villarreal, B Groven, D Lin, ... Solid-State Electronics 209, 108781, 2023 | 1 | 2023 |
| Self-patterned ultra-sharp diamond tips and their application for advanced nanoelectronics device characterization by electrical SPM L Wouters, T Boehme, L Mana, T Hantschel Micro and Nano Engineering 19, 100195, 2023 | 2 | 2023 |
| Conductivity enhancement in transition metal dichalcogenides: a complex water intercalation and desorption mechanism J Serron, A Minj, V Spampinato, A Franquet, Y Rybalchenko, ME Boulon, ... ACS Applied Materials & Interfaces 15 (21), 26175-26189, 2023 | 4 | 2023 |
| Offcut angle determination using electron channeling patterns H Han, L Strakos, T Hantschel, T Vystavel, C Porret US Patent 11,650,171, 2023 | 1 | 2023 |
| Correlating Structural and Electrical Characteristics of Threading Dislocations in -on- Heterostructures and p-n Diodes by Multiple Microscopy Techniques A Minj, K Geens, H Liang, H Han, C Noël, B Bakeroot, K Paredis, M Zhao, ... Physical Review Applied 19 (3), 034081, 2023 | | 2023 |
| Correlated Intrinsic Electrical and Chemical Properties of Epitaxial WS2 via Combined C‐AFM and ToF‐SIMS Characterization V Spampinato, Y Shi, J Serron, A Minj, B Groven, T Hantschel, ... Advanced Materials Interfaces 10 (7), 2202016, 2023 | 2 | 2023 |
| Ensemble RBS: Probing the compositional profile of 3D microscale structures N Claessens, P Couture, J England, R Vos, T Hantschel, W Vandervorst, ... Surfaces and interfaces 32, 102101, 2022 | 5 | 2022 |
| Oil as an enabler for efficient materials removal in three-dimensional scanning probe microscopy applications C Noël, L Wouters, K Paredis, U Celano, T Hantschel Frontiers in Mechanical Engineering 7, 797962, 2021 | 2 | 2021 |
| Crystalline defect analysis in epitaxial Si0. 7Ge0. 3 layer using site-specific ECCI-STEM H Han, L Strakos, T Hantschel, C Porret, T Vystavel, R Loo, M Caymax Micron 150, 103123, 2021 | 4 | 2021 |
| Application and optimization of automated ECCI mapping to the analysis of lowly defective epitaxial films on blanket or patterned wafers H Han, T Hantschel, P Lagrain, C Porret, R Loo, M Baryshnikova, ... International Symposium for Testing and Failure Analysis 84215, 211-216, 2021 | 2 | 2021 |
| Improving tomographic sensing of Scalpel SPM with multi-probe functionality and automatic removal rate extraction C O’Sullivan, M Tedaldi, C Drilakis, T Hantschel, ADL Humphris, JP Hole, ... 2021 IEEE International Symposium on the Physical and Failure Analysis of …, 2021 | 1 | 2021 |
| Method and tip substrate for scanning probe microscopy T Hantschel, H Bender, K Paredis, A Kanniainen US Patent 11,112,427, 2021 | | 2021 |
| Interfacial conductivity enhancement and pore confinement conductivity-lowering behavior inside the nanopores of solid silica-gel nanocomposite electrolytes A Sagara, H Yabe, X Chen, B Put, T Hantschel, M Mees, H Arase, ... ACS Applied Materials & Interfaces 13 (34), 40543-40551, 2021 | 15 | 2021 |
