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Paul McIntyre
Paul McIntyre
Professor of Materials Science and Engineering, Stanford University
在 stanford.edu 的电子邮件经过验证 - 首页
标题
引用次数
年份
(Paper CH011) effect of strain, microstructure, and interfaces on tunability and relaxor-like dielectric behavior in barium strontium titanate thin-films
RJ Zednik, PC McIntyre, JD Baniecki, M Ishii, K Kurihara
2008 17th IEEE International Symposium on the Applications of Ferroelectrics …, 2008
2008
> 10% solar-to-hydrogen efficiency unassisted water splitting on ALD-protected silicon heterojunction solar cells
CS Tan, KW Kemp, MR Braun, AC Meng, W Tan, CED Chidsey, W Ma, ...
Sustainable Energy & Fuels 3 (6), 1490-1500, 2019
392019
Channel MOSFETs With Self-Aligned InAs Source/Drain Formed by MEE Regrowth
U Singisetti, MA Wistey, GJ Burek, AK Baraskar, BJ Thibeault, ...
IEEE Electron Device Letters 30 (11), 1128-1130, 2009
1162009
0.37 mS/μm In0.53Ga0.47As MOSFET with 5 nm channel and self-aligned epitaxial raised source/drain
U Singisetti, MA Wistey, GJ Burek, AK Baraskar, J Cagnon, BJ Thibeault, ...
2009 Device Research Conference, 253-254, 2009
12009
0.37 mS/µm In0. 53Ga0. 47As MOSFET with 5 nm channel and Self-aligned Epitaxial Raised Source/Drain
U Singisetti, MA Wistey, GJ Burek, AK Baraskar, J Cagnon, BJ Thibeault, ...
IEEE Device Research Conf, 253, 2009
22009
17.2 Improvement in High-k (HfO~ 2/SiO~ 2) Reliability by Incorporation of Fluorine
KI Seo, R Sreenivasan, PC McIntyre, KC Saraswat
INTERNATIONAL ELECTRON DEVICES MEETING 1 (1), 429-432, 2003
2003
2022 solar fuels roadmapThe
G Segev, J Kibsgaard, C Hahn, ZJ Xu, WHS Cheng, TG Deutsch, C Xiang, ...
Journal of physics: D. Applied physics 55 (32), 0
3D-stacked strained SiGe/Ge gate-all-around (GAA) structure fabricated by 3D Ge condensation
J Suh, AC Meng, M Jaikissoon, M Braun, TR Kim, AF Marshall, A Pakzad, ...
2019 Device Research Conference (DRC), 249-250, 2019
42019
4 bits/cell hybrid 1F1R for high density embedded non-volatile memory and its application for compute in memory
WC Chen, F Huang, S Qin, Z Yu, Q Lin, PC McIntyre, SS Wong, ...
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and …, 2022
42022
A Distributed Bulk-Oxide Trap Model forInGaAs MOS Devices
Y Yuan, B Yu, J Ahn, PC McIntyre, PM Asbeck, MJW Rodwell, Y Taur
IEEE Transactions on Electron Devices 59 (8), 2100-2106, 2012
1652012
A Distributed Model for Border Traps in MOS Devices
Y Yuan, L Wang, B Yu, B Shin, J Ahn, PC McIntyre, PM Asbeck, ...
IEEE Electron Device Letters 32 (4), 485-487, 2011
2142011
A germanium NMOSFET process integrating metal gate and improved hi-/spl kappa/dielectrics
CO Chui, H Kim, PC McIntyre, KC Saraswat
IEEE International Electron Devices Meeting 2003, 18.3. 1-18.3. 4, 2003
872003
a good fit
MOS Al2O3-InGaAs, HP Yuan, JA Chen, PC McIntyre, Y Taur
Electronics Letters 49 (7), 2013
2013
A novel self-aligned gate-lost MOSFET process comparing high-/spl kappa/candidates
CO Chui, H Kim, JP McVittie, BB Triplett, PC McIntyre, KC Saraswat
International Semiconductor Device Research Symposium, 2003, 464-465, 2003
42003
A sub-400/spl deg/C germanium MOSFET technology with high-/spl kappa/dielectric and metal gate
CO Chui, H Kim, D Chi, BB Triplett, PC Mcintyre, KC Saraswat
Digest. International Electron Devices Meeting,, 437-440, 2002
3232002
A three-dimensional phase field model for nanowire growth by the vapor–liquid–solid mechanism
Y Wang, S Ryu, PC McIntyre, W Cai
Modelling and Simulation in Materials Science and Engineering 22 (5), 055005, 2014
232014
A unified two-band model for oxide traps and interface states in MOS capacitors
Y Taur, HP Chen, Q Xie, J Ahn, PC McIntyre, D Lin, A Vais, D Veksler
IEEE Transactions on Electron Devices 62 (3), 813-820, 2015
102015
Achieving area-selective atomic layer deposition on patterned substrates by selective surface modification
R Chen, H Kim, PC McIntyre, DW Porter, SF Bent
Applied Physics Letters 86 (19), 2005
1862005
Adhesion promoting sacrificial etch stop layer in advanced capacitor structures
MR Visokay, L Colombo, P McIntyre, SR Summerfelt
US Patent 5,972,722, 1999
741999
Admittance and subthreshold characteristics of atomic-layer-deposition Al2O3 on In0. 53Ga0. 47As in surface and buried channel flatband metal-oxide-semiconductor field effect …
GW Paterson, SJ Bentley, MC Holland, IG Thayne, J Ahn, RD Long, ...
Journal of Applied Physics 111 (10), 2012
62012
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