| High resolution optical frequency domain reflectometry for analyzing intra-chip reflections D Zhao, D Pustakhod, K Williams, X Leijtens IEEE Photonics Technology Letters 29 (16), 1379-1382, 2017 | 41 | 2017 |
| Open standards for automation of testing of photonic integrated circuits S Latkowski, D Pustakhod, M Chatzimichailidis, W Yao, XJM Leijtens IEEE Journal of Selected Topics in Quantum Electronics 25 (5), 1-8, 2019 | 29 | 2019 |
| Fast and Robust Method for Measuring Semiconductor Optical Amplifier Gain D Pustakhod, K Williams, X Leijtens IEEE Journal of Selected Topics in Quantum Electronics 24 (1), 1-9, 2018 | 29 | 2018 |
| High-Resolution AWG-Based Fiber Bragg Grating Interrogator D Pustakhod, E Kleijn, K Williams, X Leijtens IEEE Photonics Technology Letters 99, 2016 | 22 | 2016 |
| Amplitude and Phase Error Correction Algorithm for MMI Based Mach–Zehnder Interferometers E Kleijn, EM van Vliet, D Pustakhod, MK Smit, XJM Leijtens Journal of Lightwave Technology 33 (11), 2233-2239, 2015 | 14 | 2015 |
| Method for Polarization-Resolved Measurement of Electroabsorption D Pustakhod, K Williams, X Leijtens IEEE Photonics Journal 10 (2), 1-11, 2018 | 11 | 2018 |
| An integrated photonic device for on-chip magneto-optical memory reading FE Demirer, Y Baron, S Reniers, D Pustakhod, R Lavrijsen, J van der Tol, ... Nanophotonics 11 (14), 3319-3329, 2022 | 9 | 2022 |
| Test Methods and Processes in Manufacturing Chain of Photonic Integrated Circuits S Latkowski, D Pustakhod, W Yao, X Leijtens, K Williams 2018 20th International Conference on Transparent Optical Networks (ICTON), 1-4, 2018 | 8 | 2018 |
| Integrated high performance TE/TM Converters for Polarization Independence in Semiconductor Optical Amplifiers M Felicetti, JJGM Van der Tol, EJ Geluk, D Pustakhod, M Wale, M Smit Journal of Lightwave Technology, 2015 | 8 | 2015 |
| 1300 nm Semiconductor Optical Amplifier Compatible With an InP Monolithic Active/Passive Integration Technology J Hazan, S Andreou, D Pustakhod, S Kleijn, KA Williams, EAJM Bente IEEE Photonics Journal 14 (3), 1-11, 2022 | 7 | 2022 |
| Foundry photonic process extension with bandgap tuning using selective area growth F Lemaitre, C Fortin, N Lagay, G Binet, D Pustakhod, J Decobert, ... IEEE Journal of Selected Topics in Quantum Electronics 25 (5), 1-8, 2019 | 7 | 2019 |
| Photonic-crystal-fiber-coupled photoluminescence interrogation of nitrogen vacancies in diamond nanoparticles IV Fedotov, NA Safronov, YA Shandarov, AY Tashchilina, AB Fedotov, ... Laser Physics Letters 9 (2), 151, 2011 | 7 | 2011 |
| Random bits from quantum jumps VN Chizhevsky, DB Horoshko, DI Pustakhod, SY Kilin Proceedings of SPIE, the International Society for Optical Engineering …, 2007 | 7 | 2007 |
| Optical frequency domain reflectometry for characterization of distributed Bragg reflectors D Zhao, D Pustakhod, LM Augustin, J Bolk, KA Williams, XJM Leijtens Proceedings of the 19th European Conference on Integrated Optics, April 3-5 …, 2017 | 5 | 2017 |
| Design of uniform and non-uniform DBR Gratings using transfer-matrix method D Zhao, LM Augustin, D Pustakhod, KA Williams, XJM Leijtens 20th Annual Symposium of the IEEE Photonics Benelux Chapter, 87-90, 2015 | 5 | 2015 |
| On-chip Diode Temperature Sensors on InP-based Generic Foundry Platform W Tian, D Harmsen, O Çirkinoglu, B Bas, P Van Den Berg, R De Meulder, ... 2023 Opto-Electronics and Communications Conference (OECC), 1-4, 2023 | 4 | 2023 |
| High resolution optical frequency domain reflectometry for measurement of waveguide group refractive index D Zhao, D Pustakhod, K Williams, X Leijtens 2017 IEEE Photonics Conference (IPC), 537-538, 2017 | 4 | 2017 |
| Broadband multimode interference coupler on InP substrate with flat wavelength response over the whole O-band J Hazan, D Pustakhod, S Kleijn, S Andreou, KA Williams, EAJM Bente 2021 IEEE Photonics Conference (IPC), 1-2, 2021 | 3 | 2021 |
| Dual-input scheme for high resolution integrated AWG-based fiber Bragg grating interrogator D PUSTAKHOD, K WILLIAMS, X LEIJTENS 18th European Conference on Integrated Optics (ECIO 2016), 1-4, 2016 | 3 | 2016 |
| Optical frequency domain reflectometry for characterization of waveguide crossings D Zhao, D Pustakhod, L Augustin, K Williams, X Leijtens Proceedings of 18the Eur. Conf. on Int. Opt., 0-14, 2016 | 3 | 2016 |
Xaveer LeijtensAssociate professor, Institute for Photonic Integration, Eindhoven University of Technology在 tue.nl 的电子邮件经过验证
