| Electronegativity determination of individual surface atoms by atomic force microscopy J Onoda, M Ondráček, P Jelínek, Y Sugimoto Nature Communications 8 (1), 15155, 2017 | 58 | 2017 |
| Effects of Pb intercalation on the structural and electronic properties of epitaxial graphene on SiC A Yurtsever, J Onoda, T Iimori, K Niki, T Miyamachi, M Abe, S Mizuno, ... Small 12 (29), 3956-3966, 2016 | 55 | 2016 |
| Field-assisted oxygen etching for sharp field-emission tip F Rahman, J Onoda, K Imaizumi, S Mizuno Surface Science 602 (12), 2128-2134, 2008 | 52 | 2008 |
| Subsurface Charge Repulsion of Adsorbed H-Adatoms on TiO2(110) J Onoda, CL Pang, A Yurtsever, Y Sugimoto The Journal of Physical Chemistry C 118 (25), 13674-13679, 2014 | 32 | 2014 |
| Structural identification of silicene on the Ag (111) surface by atomic force microscopy L Feng, K Yabuoshi, Y Sugimoto, J Onoda, M Fukuda, T Ozaki Physical Review B 98 (19), 195311, 2018 | 21 | 2018 |
| High-resolution imaging of silicene on an Ag (111) surface by atomic force microscopy J Onoda, K Yabuoshi, H Miyazaki, Y Sugimoto Physical Review B 96 (24), 241302, 2017 | 21 | 2017 |
| Identification of Si and Ge atoms by atomic force microscopy J Onoda, K Niki, Y Sugimoto Physical Review B 92 (15), 155309, 2015 | 19 | 2015 |
| STEM observation of tungsten tips sharpened by field-assisted oxygen etching J Onoda, S Mizuno, H Ago Surface science 604 (13-14), 1094-1099, 2010 | 19 | 2010 |
| Fabrication of< 1 1 0> oriented tungsten nano-tips by field-assisted water etching J Onoda, S Mizuno Applied surface science 257 (20), 8427-8432, 2011 | 18 | 2011 |
| The local electronic properties of individual Pt atoms adsorbed on TiO 2 (110) studied by Kelvin probe force microscopy and first-principles simulations A Yurtsever, D Fernández-Torre, J Onoda, M Abe, S Morita, Y Sugimoto, ... Nanoscale 9 (18), 5812-5821, 2017 | 17 | 2017 |
| Force spectroscopy using a quartz length-extension resonator Y Sugimoto, J Onoda Applied Physics Letters 115 (17), 2019 | 14 | 2019 |
| Charging of electron beam irradiated amorphous carbon thin films at liquid nitrogen temperature S Hettler, J Onoda, R Wolkow, J Pitters, M Malac Ultramicroscopy 196, 161-166, 2019 | 14 | 2019 |
| Pt atoms adsorbed on studied with noncontact atomic force microscopy and first-principles simulations D Fernández-Torre, A Yurtsever, J Onoda, M Abe, S Morita, Y Sugimoto, ... Physical Review B 91 (7), 075401, 2015 | 14 | 2015 |
| Field emission from W tips sharpened by field-assisted nitrogen and oxygen etching J Onoda, F Rahman, S Mizuno e-Journal of Surface Science and Nanotechnology 6, 152-156, 2008 | 14 | 2008 |
| Initial and secondary oxidation products on the Si (111)-(7× 7) surface identified by atomic force microscopy and first principles calculations J Onoda, M Ondráček, A Yurtsever, P Jelínek, Y Sugimoto Applied Physics Letters 104 (13), 2014 | 13 | 2014 |
| (2n × 1) Reconstructions of TiO2(011) Revealed by Noncontact Atomic Force Microscopy and Scanning Tunneling Microscopy CL Pang, A Yurtsever, J Onoda, Y Sugimoto, G Thornton The Journal of Physical Chemistry C 118 (40), 23168-23174, 2014 | 11 | 2014 |
| Chemical identification of the foremost tip atom in atomic force microscopy J Onoda, H Miyazaki, Y Sugimoto Nano Letters 20 (3), 2000-2004, 2020 | 10 | 2020 |
| Less-ordered structures of silicene on Ag (111) surface revealed by atomic force microscopy J Onoda, L Feng, K Yabuoshi, Y Sugimoto Physical Review Materials 3 (10), 104002, 2019 | 9 | 2019 |
| Imaging the TiO2(011)-(2 × 1) Surface using Noncontact Atomic Force Microscopy and Scanning Tunneling Microscopy A Yurtsever, J Onoda, M Abe, CL Pang, Y Sugimoto The Journal of Physical Chemistry C 120 (6), 3390-3395, 2016 | 8 | 2016 |
| Ohmic Contact to Two-Dimensional Nanofabricated Silicon Structures with a Two-Probe Scanning Tunneling Microscope J Onoda, A Khademi, RA Wolkow, J Pitters ACS nano 15 (12), 19377-19386, 2021 | 5 | 2021 |
Pavel JelínekInstitute of Physics, Czech Academy of Sciences, Czech Republic在 fzu.cz 的电子邮件经过验证
