| Application of the generalized differential quadrature method to the study of pull-in phenomena of MEMS switches H Sadeghian, G Rezazadeh, PM Osterberg Journal of Microelectromechanical Systems 16 (6), 1334-1340, 2007 | 184 | 2007 |
| Characterizing size-dependent effective elastic modulus of silicon nanocantilevers using electrostatic pull-in instability H Sadeghian, CK Yang, JFL Goosen, E Van Der Drift, A Bossche, ... Applied Physics Letters 94 (22), 221903, 2009 | 170 | 2009 |
| Effects of size and defects on the elasticity of silicon nanocantilevers H Sadeghian, CK Yang, JFL Goosen, A Bossche, U Staufer, PJ French, ... Journal of micromechanics and microengineering 20 (6), 064012, 2010 | 94 | 2010 |
| On the size-dependent elasticity of silicon nanocantilevers: impact of defects H Sadeghian, H Goosen, A Bossche, B Thijsse, F Van Keulen Journal of Physics D: Applied Physics 44 (7), 072001, 2011 | 65 | 2011 |
| On the size-dependent elasticity of silicon nanocantilevers: impact of defects H Sadeghian, H Goosen, A Bossche, B Thijsse, F van Keulen Journal of Physics D: Applied Physics 44 (7), 072001, 2011 | 65 | 2011 |
| Comparison of generalized differential quadrature and Galerkin methods for the analysis of micro-electro-mechanical coupled systems H Sadeghian, G Rezazadeh Communications in Nonlinear Science and Numerical Simulation 14 (6), 2807-2816, 2009 | 57 | 2009 |
| Effects of size and surface on the elasticity of silicon nanoplates: Molecular dynamics and semi-continuum approaches H Sadeghian, JFL Goosen, A Bossche, BJ Thijsse, F van Keulen Thin Solid Films 520 (1), 391-399, 2011 | 48 | 2011 |
| A comprehensive model to study nonlinear behavior of multilayered micro beam switches G Rezazadeh Microsystem Technologies 14 (1), 135-141, 2008 | 45 | 2008 |
| A comprehensive model to study nonlinear behavior of multilayered micro beam switches G Rezazadeh Microsystem Technologies 14 (1), 135-141, 2007 | 45 | 2007 |
| Effects of single vacancy defect position on the stability of carbon nanotubes RH Poelma, H Sadeghian, S Koh, GQ Zhang Microelectronics Reliability 52 (7), 1279-1284, 2012 | 43 | 2012 |
| A numerical experimental approach for characterizing the elastic properties of thin films: application of nanocantilevers RH Poelma, H Sadeghian, SPM Noijen, JJM Zaal, GQ Zhang Journal of Micromechanics and Microengineering 21 (6), 065003, 2011 | 39 | 2011 |
| High-throughput atomic force microscopes operating in parallel H Sadeghian, R Herfst, B Dekker, J Winters, T Bijnagte, R Rijnbeek Review of Scientific Instruments 88 (3), 033703, 2017 | 38 | 2017 |
| High-throughput atomic force microscopes operating in parallel H Sadeghian, R Herfst, B Dekker, J Winters, T Bijnagte, R Rijnbeek Review of Scientific Instruments 88 (3), 033703, 2017 | 38 | 2017 |
| Mapping Buried Nanostructures Using Subsurface Ultrasonic Resonance Force Microscopy MH van Es, A Mohtashami, RMT Thijssen, D Piras, PLMJ van Neer, ... Ultramicroscopy, 2017 | 33 | 2017 |
| Surface stress-induced change in overall elastic behavior and self-bending of ultrathin cantilever plates H Sadeghian, JFL Goosen, A Bossche, F Van Keulen Applied Physics Letters 94 (23), 231908, 2009 | 33 | 2009 |
| Pull-in instability investigation of circular micro pump subjected to nonlinear electrostatic force P Soleymani, H Sadeghian, A Tahmasebi, G Rezazadeh Sensors & Transducers Journal 69 (7), 622-628, 2006 | 32 | 2006 |
| Application of electrostatic pull-in instability on sensing adsorbate stiffness in nanomechanical resonators H Sadeghian, H Goosen, A Bossche, F van Keulen Thin Solid Films 518 (17), 5018-5021, 2010 | 26 | 2010 |
| Introduction of a high throughput SPM for defect inspection and process control H Sadeghian, NB Koster, TC van den Dool Metrology, Inspection, and Process Control for Microlithography XXVII 8681 …, 2013 | 25 | 2013 |
| Pull-in voltage of fixed–fixed end type MEMS switches with variative electrostatic area H Sadeghian, G Rezazadeh, E Malekpour, A Shafipour Sens Transducers 66 (4), 526-533, 2006 | 24 | 2006 |
| A miniaturized, high frequency mechanical scanner for high speed atomic force microscope using suspension on dynamically determined points R Herfst, B Dekker, G Witvoet, W Crowcombe, D de Lange, H Sadeghian Review of Scientific Instruments 86 (11), 113703, 2015 | 23 | 2015 |
