| Design-oriented compact models for CNTFETs F Pregaldiny, C Lallement, JB Kammerer International Conference on Design and Test of Integrated Systems in …, 2006 | 65 | 2006 |
| Intrinsic limits of the sensitivity of CMOS integrated vertical Hall devices J Pascal, L Hébrard, V Frick, JB Kammerer, JP Blondé Sensors and Actuators A: Physical 152 (1), 21-28, 2009 | 42 | 2009 |
| First vertical Hall device in standard 0.35 μm CMOS technology J Pascal, L Hébrard, JB Kammerer, V Frick, JP Blondé Sensors and Actuators A: Physical 147 (1), 41-46, 2008 | 40 | 2008 |
| Horizontal Hall effect sensor with high maximum absolute sensitivity JB Kammerer, L Hébrard, V Frick, P Poure, F Braun IEEE Sensors Journal 3 (6), 700-707, 2003 | 40 | 2003 |
| Compact modeling of a magnetic tunnel junction—Part I: Dynamic magnetization model JB Kammerer, M Madec, L Hébrard IEEE Transactions on Electron Devices 57 (6), 1408-1415, 2010 | 39 | 2010 |
| Compact modeling and applications of CNTFETs for analog and digital circuit design F Pregaldiny, JB Kammerer, C Lallement 2006 13th IEEE International Conference on Electronics, Circuits and Systems …, 2006 | 38 | 2006 |
| Compact modeling of a magnetic tunnel junction—Part II: Tunneling current model M Madec, JB Kammerer, L Hébrard IEEE Transactions on Electron Devices 57 (6), 1416-1424, 2010 | 36 | 2010 |
| Compact modeling of magnetic tunnel junction M Madec, JB Kammerer, F Pregaldiny, L Hebrard, C Lallement 2008 Joint 6th International IEEE Northeast Workshop on Circuits and Systems …, 2008 | 28 | 2008 |
| A chopper stabilized biasing circuit suitable for cascaded wheatstone-bridge-like sensors L Hébrard, JB Kammerer, F Braun IEEE Transactions on Circuits and Systems I: Regular Papers 52 (8), 1653-1665, 2005 | 25 | 2005 |
| Electro-thermal high-level modeling of integrated circuits JC Krencker, JB Kammerer, Y Hervé, L Hébrard Microelectronics Journal 45 (5), 491-499, 2014 | 20 | 2014 |
| A two-axis magnetometer using a single magnetic tunnel junction JB Kammerer, L Hébrard, M Hehn, F Braun, P Alnot, A Schuhl IEEE Sensors Journal 4 (3), 313-321, 2004 | 19 | 2004 |
| Direct electro-thermal simulation of integrated circuits using standard CAD tools JC Krencker, JB Kammerer, Y Hervé, L Hébrard 2010 16th International Workshop on Thermal Investigations of ICs and …, 2010 | 16 | 2010 |
| Compact modeling of a magnetic tunnel junction using VHDL-AMS: computer aided design of a two-axis magnetometer JB Kammerer, L Hebrard, M Hehn, F Braun, P Alnot, A Schuhl SENSORS, 2004 IEEE, 1558-1561, 2004 | 15 | 2004 |
| Towards a Hall effect magnetic tracking device for MRI JB Schell, JB Kammerer, L Hébrard, E Breton, D Gounot, L Cuvillon, ... 2013 35th Annual International Conference of the IEEE Engineering in …, 2013 | 14 | 2013 |
| An accurate compact model for CMOS cross-shaped Hall effect sensors M Madec, JB Kammerer, L Hébrard, C Lallement Sensors and Actuators A: Physical 171 (2), 69-78, 2011 | 13 | 2011 |
| 3D electro-thermal simulations of analog ICs carried out with standard CAD tools and Verilog-A JC Krencker, JB Kammerer, Y Hervé, L Hébrard 2011 17th International Workshop on Thermal Investigations of ICs and …, 2011 | 12 | 2011 |
| CMOS 3D Hall probe for magnetic field measurement in MRI scanner JB Schell, JB Kammerer, L Hébrard, E Breton, D Gounot, L Cuvillon, ... 10th IEEE International NEWCAS Conference, 517-520, 2012 | 11 | 2012 |
| Hall effect sensors integrated in standard technology and optimized with on-chip circuitry JB Kammerer, L Hébrard, V Frick, P Poure, F Braun The European Physical Journal Applied Physics 36 (1), 49-64, 2006 | 11 | 2006 |
| Multiphysics Simulation of Biosensors Involving 3D Biological Reaction–Diffusion Phenomena in a Standard Circuit EDA Environment M Madec, L Hébrard, JB Kammerer, A Bonament, E Rosati, C Lallement IEEE Transactions on Circuits and Systems I: Regular Papers 66 (6), 2188-2197, 2019 | 10 | 2019 |
| Design and modelling of a voltage controlled N-well resistor using the MOS tunneling diode structure JB Kammerer, L Hebrard, V Frick, P Poure, F Braun 9th International Conference on Electronics, Circuits and Systems 3, 1123-1126, 2002 | 10 | 2002 |
