A subthermionic tunnel field-effect transistor with an atomically thin channel D Sarkar, X Xie, W Liu, W Cao, J Kang, Y Gong, S Kraemer, PM Ajayan, ... Nature 526 (7571), 91-95, 2015 | 989 | 2015 |
2D Semiconductor FETs--Projections and Design for Sub-10 nm VLSI W Cao, J Kang, D Sarkar, W Liu, K Banerjee Electron Devices, IEEE Transactions on 62 (11), 3459-3469, 2015 | 311 | 2015 |
A compact current–voltage model for 2D semiconductor based field-effect transistors considering interface traps, mobility degradation, and inefficient doping effect W Cao, J Kang, W Liu, K Banerjee IEEE Transactions on Electron Devices 61 (12), 4282-4290, 2014 | 176 | 2014 |
Impact of Contact on the Operation and Performance of Back-Gated Monolayer MoS2 Field-Effect-Transistors W Liu, D Sarkar, J Kang, W Cao, K Banerjee Acs Nano 9 (8), 7904-7912, 2015 | 174 | 2015 |
Is negative capacitance FET a steep-slope logic switch? W Cao, K Banerjee Nature communications 11 (1), 196, 2020 | 156 | 2020 |
Intercalation doped multilayer-graphene-nanoribbons for next-generation interconnects J Jiang, J Kang, W Cao, X Xie, H Zhang, JH Chu, W Liu, K Banerjee Nano letters 17 (3), 1482-1488, 2017 | 155 | 2017 |
High-performance few-layer-MoS2 field-effect-transistor with record low contact-resistance W Liu, J Kang, W Cao, D Sarkar, Y Khatami, K Banerjee Electron Devices Meeting (IEDM), 2013 IEEE International, 2013 | 144 | 2013 |
Improvement in reliability of tunneling field-effect transistor with pnin structure W Cao, CJ Yao, GF Jiao, D Huang, HY Yu, MF Li IEEE transactions on electron devices 58 (7), 2122-2126, 2011 | 136 | 2011 |
Graphene and beyond-graphene 2D crystals for next-generation green electronics J Kang, W Cao, X Xie, D Sarkar, W Liu, K Banerjee Micro-and Nanotechnology Sensors, Systems, and Applications VI 9083, 20-26, 2014 | 133 | 2014 |
Ultimate monolithic-3D integration with 2D materials: rationale, prospects, and challenges J Jiang, K Parto, W Cao, K Banerjee IEEE Journal of the Electron Devices Society 7, 878-887, 2019 | 95 | 2019 |
2-D Layered Materials for Next-Generation Electronics: Opportunities and Challenges W Cao, J Jiang, X Xie, A Pal, JH Chu, J Kang, K Banerje IEEE Transactions on Electron Devices 65 (10), 4109 - 4121, 2018 | 93 | 2018 |
Subthreshold-swing physics of tunnel field-effect transistors W Cao, D Sarkar, Y Khatami, J Kang, K Banerjee AIP Advance 4 (06), 067141-1- 067141-9, 2014 | 77 | 2014 |
The future transistors W Cao, H Bu, M Vinet, M Cao, S Takagi, S Hwang, T Ghani, K Banerjee Nature 620 (7974), 501-515, 2023 | 75 | 2023 |
Effect of interface traps and oxide charge on drain current degradation in tunneling field-effect transistors XY Huang, GF Jiao, W Cao, D Huang, HY Yu, ZX Chen, N Singh, GQ Lo, ... IEEE Electron Device Letters 31 (8), 779-781, 2010 | 64 | 2010 |
Can 2D-nanocrystals extend the lifetime of floating-gate transistor based nonvolatile memory? W Cao, J Kang, S Bertolazzi, A Kis, K Banerjee IEEE Transactions on Electron Devices 61 (10), 3456-3464, 2014 | 54 | 2014 |
An Ultra-Short Channel Monolayer MoS2 FET Defined By the Curvature of a Thin Nanowire W Cao, W Liu, J Kang, K Banerjee IEEE Electron Device Letters 37 (11), 1497 - 1500, 2016 | 44 | 2016 |
Tilting angle of nanocolumnar films fabricated by oblique angle deposition H Zhu, W Cao, GK Larsen, R Toole, Y Zhao Journal of Vacuum Science & Technology B 30 (3), 4, 2012 | 43 | 2012 |
One-Dimensional Edge Contacts to Two-Dimensional Transition-Metal Dichalcogenides: Uncovering the Role of Schottky-Barrier Anisotropy in Charge Transport across Mo S 2/Metal … K Parto, A Pal, T Chavan, K Agashiwala, CH Yeh, W Cao, K Banerjee Physical Review Applied 15 (6), 064068, 2021 | 39 | 2021 |
Designing band-to-band tunneling field-effect transistors with 2D semiconductors for next-generation low-power VLSI W Cao, J Jiang, J Kang, D Sarkar, W Liu, K Banerjee 2015 IEEE International Electron Devices Meeting (IEDM), 12.3. 1-12.3. 4, 2015 | 38 | 2015 |
Performance Evaluation and Design Considerations of 2D Semiconductor based FETs for Sub-10 nm VLSI W Cao, J Kang, D Sarkar, W Liu, K Banerjee Electron Devices Meeting (IEDM), 2014 IEEE International, 30.5.1- 30.5.4, 2014 | 34 | 2014 |