Localized surface plasmon resonance nanosensor: a high-resolution distance-dependence study using atomic layer deposition AV Whitney, JW Elam, S Zou, AV Zinovev, PC Stair, GC Schatz, ... The Journal of Physical Chemistry B 109 (43), 20522-20528, 2005 | 394 | 2005 |
Operando tribochemical formation of onion-like-carbon leads to macroscale superlubricity D Berman, B Narayanan, MJ Cherukara, SKRS Sankaranarayanan, ... Nature communications 9 (1), 1164, 2018 | 233 | 2018 |
Atomic layer deposition of palladium films on Al2O3 surfaces JW Elam, A Zinovev, CY Han, HH Wang, U Welp, JN Hryn, MJ Pellin Thin Solid Films 515 (4), 1664-1673, 2006 | 219 | 2006 |
Nanoscale friction properties of graphene and graphene oxide D Berman, A Erdemir, AV Zinovev, AV Sumant Diamond and Related Materials 54, 91-96, 2015 | 125 | 2015 |
Metal-induced rapid transformation of diamond into single and multilayer graphene on wafer scale D Berman, SA Deshmukh, B Narayanan, SKRS Sankaranarayanan, ... Nature communications 7 (1), 1-8, 2016 | 82 | 2016 |
Nucleation and growth of noble metals on oxide surfaces using atomic layer deposition JW Elam, AVV Zinovev, MJ Pellin, DJ Comstock, MC Hersam ECS Transactions 3 (15), 271, 2007 | 77 | 2007 |
Laser-driven acoustic desorption of organic molecules from back-irradiated solid foils AV Zinovev, IV Veryovkin, JF Moore, MJ Pellin Analytical chemistry 79 (21), 8232-8241, 2007 | 70 | 2007 |
Secondary electron yield of emissive materials for large-area micro-channel plate detectors: surface composition and film thickness dependencies SJ Jokela, IV Veryovkin, AV Zinovev, JW Elam, AU Mane, Q Peng, ... Physics Procedia 37, 740-747, 2012 | 67 | 2012 |
Atomic layer deposition of W on nanoporous carbon aerogels JW Elam, JA Libera, MJ Pellin, AV Zinovev, JP Greene, JA Nolen Applied Physics Letters 89 (5), 2006 | 65 | 2006 |
A brief technical history of the large-area picosecond photodetector (LAPPD) collaboration BW Adams, K Attenkofer, M Bogdan, K Byrum, A Elagin, JW Elam, ... arXiv preprint arXiv:1603.01843, 2016 | 59 | 2016 |
Top-surface characterization of a near frictionless carbon film JA Johnson, D Holland, JB Woodford, A Zinovev, IA Gee, OL Eryilmaz, ... Diamond and related materials 16 (2), 209-215, 2007 | 42 | 2007 |
Oxidation and removal mechanisms during chemical–mechanical planarization D Ng, M Kulkarni, J Johnson, A Zinovev, D Yang, H Liang Wear 263 (7-12), 1477-1483, 2007 | 36 | 2007 |
TOF SIMS characterization of SEI layer on battery electrodes IV Veryovkin, CE Tripa, AV Zinovev, SV Baryshev, Y Li, DP Abraham Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2014 | 33 | 2014 |
Etching of hexagonal SiC surfaces in chlorine-containing gas media at ambient pressure AV Zinovev, JF Moore, J Hryn, MJ Pellin Surface science 600 (11), 2242-2251, 2006 | 31 | 2006 |
Comparison of secondary electron emission simulation to experiment Z Insepov, V Ivanov, SJ Jokela, I Veryovkin, A Zinovev, H Frisch Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2011 | 29 | 2011 |
Characterization of surface modifications by white light interferometry: applications in ion sputtering, laser ablation, and tribology experiments SV Baryshev, RA Erck, JF Moore, AV Zinovev, CE Tripa, IV Veryovkin JoVE (Journal of Visualized Experiments), e50260, 2013 | 23 | 2013 |
Coating of SiC surface by thin carbon films using the carbide-derived carbon process AV Zinovev, JW Elam, JF Moore, JN Hryn, O Auciello, JA Carlisle, ... Thin Solid Films 469, 135-141, 2004 | 23 | 2004 |
White light interferometry for quantitative surface characterization in ion sputtering experiments SV Baryshev, AV Zinovev, CE Tripa, RA Erck, IV Veryovkin Applied Surface Science 258 (18), 6963-6968, 2012 | 20 | 2012 |
The Characterization Of Secondary Electron Emitters For Use In Large Area Photo‐Detectors SJ Jokela, IV Veryovkin, AV Zinovev, JW Elam, Q Peng, AU Mane AIP Conference Proceedings 1336 (1), 208-212, 2011 | 17 | 2011 |
On the trends in kinetic energies of secondary ions produced by polyatomic ion bombardment IV Veryovkin, SF Belykh, A Adriaens, AV Zinovev, F Adams Applied surface science 231, 101-105, 2004 | 17 | 2004 |