| Report on the first international comparison of small force facilities: a pilot study at the micronewton level MS Kim, JR Pratt, U Brand, CW Jones Metrologia 49 (1), 70, 2011 | 80 | 2011 |
| Open questions in surface topography measurement: a roadmap R Leach, C Evans, L He, A Davies, A Duparré, A Henning, CW Jones, ... Surface Topography: Metrology and Properties 3 (1), 013001, 2015 | 66 | 2015 |
| Transient photocurrent and photovoltage mapping for characterisation of defects in organic photovoltaics S Wood, D O'Connor, CW Jones, JD Claverley, JC Blakesley, C Giusca, ... Solar Energy Materials and Solar Cells 161, 89-95, 2017 | 46 | 2017 |
| Advances in engineering nanometrology at the National Physical Laboratory RK Leach, J Claverley, C Giusca, CW Jones, L Nimishakavi, W Sun, ... Measurement Science and Technology 23 (7), 074002, 2012 | 37 | 2012 |
| Development of a new traceable areal surface texture measuring instrument RK Leach, DR Flack, EB Hughes, CW Jones Wear 266 (5-6), 552-554, 2009 | 17 | 2009 |
| Review of low force transfer artefact technologies. CW Jones, RK Leach | 15 | 2008 |
| The high dynamic range surface metrology challenge RK Leach, CW Jones, B Sherlock, A Krysinski Proceedings of the 28th Annual Meeting of the American Society for Precision …, 2013 | 14 | 2013 |
| NPL Areal Standard: a multi-function calibration artefact for surface topography measuring instruments LP Nimishakavi, CW Jones, CL Giusca Laser Metrology and Machine Performance 13, 69-72, 2019 | 13 | 2019 |
| A hybrid 2D/3D inspection concept with smart routing optimisation for high throughput, high dynamic range and traceable critical dimension metrology CW Jones, D O’Connor Measurement Science and Technology 29 (7), 074004, 2018 | 12 | 2018 |
| Adding a dynamic aspect to amplitude–wavelength space CW Jones, RK Leach Measurement Science and Technology 19 (5), 055105, 2008 | 11 | 2008 |
| Comparison of NIST SI force scale to NPL SI mass scale CW Jones, JA Kramar, S Davidson, RK Leach, JR Pratt Proc. ASPE, 1-4, 2008 | 9 | 2008 |
| Aperiodic interferometer for six degrees of freedom position measurement DP Burt, PS Dobson, KE Docherty, CW Jones, RK Leach, S Thoms, ... Optics Letters 37 (7), 1247-1249, 2012 | 7 | 2012 |
| 3D roughness standard for performance verification of topography instruments for additively-manufactured surface inspection CW Jones, W Sun, H Boulter, S Brown Measurement Science and Technology 33 (8), 084003, 2022 | 6 | 2022 |
| Thermal and dimensional evaluation of a test plate for assessing the measurement capability of a thermal imager within nuclear decommissioning storage J McMillan, M Hayes, R Hornby, S Korniliou, C Jones, D O’Connor, ... Measurement 202, 111903, 2022 | 4 | 2022 |
| Metrology challenges for highly parallel micro-manufacture R Leach, C Jones, B Sherlock, A Krysinski 10th International Conference on Multi-Material Micro Manufacture, San …, 2013 | 3 | 2013 |
| Concept and modelling of a novel active triskelion low force transfer artefact C Jones, D Chetwynd, J Singh, RK Leach Proc. 11th Int. Conf. of the Euspen (Como, Italy), 191-4, 2011 | 3 | 2011 |
| Dimensional nanometrology at the national physical laboratory A Yacoot, R Leach, B Hughes, C Giusca, C Jones, A Wilson Fifth International Symposium on Instrumentation Science and Technology 7133 …, 2009 | 3 | 2009 |
| A universal substrate sample fixture for efficient multi-instrument inspection of large, flexible substrates, with absolute position registration support C Jones, M Santiano, S Downes, R Bellotti, D O’Connor, G Picotto Proceedings of the 16th international conference of the european society for …, 2016 | 2 | 2016 |
| High precision interferometric optical encoder for inline position referencing of instrumented plastic film in a roll-to-roll system D O’Connor, G Moschetti, CW Jones, P Lovelock, P Shore, K Hollstein, ... Proc. 31st ASPE Annual Meeting, 2016 | 2 | 2016 |
| Low force metrology at the National Physical Laboratory, UK CW Jones | 2 | 2010 |
Richard LeachUniversity of Nottingham在 nottingham.ac.uk 的电子邮件经过验证
