| Mis-specification analysis of linear degradation models CY Peng, ST Tseng IEEE Transactions on Reliability 58 (3), 444-455, 2009 | 439 | 2009 |
| Optimal design for step-stress accelerated degradation tests CM Liao, ST Tseng IEEE Transactions on Reliability 55 (1), 59-66, 2006 | 304 | 2006 |
| Optimal step-stress accelerated degradation test plan for gamma degradation processes ST Tseng, N Balakrishnan, CC Tsai IEEE Transactions on Reliability 58 (4), 611-618, 2009 | 280 | 2009 |
| Optimal design for degradation tests based on gamma processes with random effects CC Tsai, ST Tseng, N Balakrishnan IEEE Transactions on Reliability 61 (2), 604-613, 2012 | 195 | 2012 |
| Using degradation data to improve fluorescent lamp reliability ST Tseng, M Hamada, CH Chiao Journal of Quality Technology 27 (4), 363-369, 1995 | 191 | 1995 |
| Determination of burn‐in parameters and residual life for highly reliable products ST Tseng, J Tang, IH Ku Naval Research Logistics (NRL) 50 (1), 1-14, 2003 | 165 | 2003 |
| Mis-specification analyses of gamma and Wiener degradation processes CC Tsai, ST Tseng, N Balakrishnan Journal of Statistical Planning and Inference 141 (12), 3725-3735, 2011 | 153 | 2011 |
| Optimal production run length for products sold with warranty RH Yeh, WT Ho, ST Tseng European Journal of Operational Research 120 (3), 575-582, 2000 | 153 | 2000 |
| Step-stress accelerated degradation analysis for highly reliable products ST Tseng, ZC Wen Journal of Quality Technology 32 (3), 209-216, 2000 | 148 | 2000 |
| Optimal preventive maintenance policy for deteriorating production systems ST Tseng IIE transactions 28 (8), 687-694, 1996 | 139 | 1996 |
| Stochastic diffusion modeling of degradation data ST Tseng, CY Peng Journal of data Science 5 (3), 315-333, 2007 | 108 | 2007 |
| Designing a degradation experiment HF Yu, ST Tseng Naval Research Logistics (NRL) 46 (6), 689-706, 1999 | 103 | 1999 |
| A study on a multivariate EWMA controller ST Tseng, RJ Chou, SP Lee Iie Transactions 34 (6), 541-549, 2002 | 94 | 2002 |
| Statistical lifetime inference with skew-Wiener linear degradation models CY Peng, ST Tseng IEEE Transactions on Reliability 62 (2), 338-350, 2013 | 88 | 2013 |
| Progressive-stress accelerated degradation test for highly-reliable products CY Peng, ST Tseng IEEE Transactions on Reliability 59 (1), 30-37, 2010 | 88 | 2010 |
| Optimal burn-in policy by using an integrated Wiener process ST Tseng, CY Peng Iie Transactions 36 (12), 1161-1170, 2004 | 87 | 2004 |
| A study of variable EWMA controller ST Tseng, AB Yeh, F Tsung, YY Chan IEEE Transactions on Semiconductor Manufacturing 16 (4), 633-643, 2003 | 86 | 2003 |
| Optimal burn-in policy for highly reliable products using gamma degradation process CC Tsai, ST Tseng, N Balakrishnan IEEE Transactions on Reliability 60 (1), 234-245, 2010 | 85 | 2010 |
| A termination rule for degradation experiments ST Tseng, HF Yu IEEE Transactions on Reliability 46 (1), 130-133, 1997 | 85 | 1997 |
| The effects of inspection errors to the imperfect EMQ model MJ Liou, ST Tseng, TM Lin IIE transactions 26 (2), 42-51, 1994 | 74 | 1994 |
N BalakrishnanMcMaster University在 mcmaster.ca 的电子邮件经过验证
