| Visualizing Lithium Distribution and Degradation of Composite Electrodes in Sulfide-based All-Solid-State Batteries Using Operando Time-of-Flight Secondary Ion … Y Yamagishi, H Morita, Y Nomura, E Igaki ACS Applied Materials & Interfaces 13 (1), 580-586, 2020 | 34 | 2020 |
| Nanosecond microscopy of capacitance at SiO2/4H-SiC interfaces by time-resolved scanning nonlinear dielectric microscopy Y Yamagishi, Y Cho Applied Physics Letters 111 (16), 2017 | 28 | 2017 |
| Lithium transport pathways guided by grain architectures in Ni-rich layered cathodes Y Nomura, K Yamamoto, Y Yamagishi, E Igaki ACS nano 15 (12), 19806-19814, 2021 | 27 | 2021 |
| Interlayer resistance and edge-specific charging in layered molecular crystals revealed by Kelvin-probe force microscopy Y Yamagishi, K Noda, K Kobayashi, H Yamada The Journal of Physical Chemistry C 119 (6), 3006-3011, 2015 | 26 | 2015 |
| Visualizing Lithiation of Graphite Composite Anodes in All-Solid-State Batteries Using Operando Time-of-Flight Secondary Ion Mass Spectrometry Y Yamagishi, H Morita, Y Nomura, E Igaki The Journal of Physical Chemistry Letters 12 (19), 4623-4627, 2021 | 18 | 2021 |
| Visualization of trapped charges being ejected from organic thin-film transistor channels by Kelvin-probe force microscopy during gate voltage sweeps Y Yamagishi, K Kobayashi, K Noda, H Yamada Applied Physics Letters 108 (9), 2016 | 15 | 2016 |
| Organic field-effect transistors with molecularly doped polymer gate buffer layer Y Yamagishi, K Noda, H Yamada, K Matsushige Synthetic metals 162 (21-22), 1887-1893, 2012 | 11 | 2012 |
| Current enhancement with contact-area-limited doping for bottom-gate, bottom-contact organic thin-film transistors K Noda, Y Wakatsuki, Y Yamagishi, Y Wada, T Toyabe, K Matsushige Japanese journal of applied physics 52 (2R), 021602, 2013 | 10 | 2013 |
| Influence of non-uniform interface defect clustering on field-effect mobility in SiC MOSFETs investigated by local deep level transient spectroscopy and device simulation K Yamasue, Y Yamagishi, Y Cho Materials science forum 1004, 627-634, 2020 | 8 | 2020 |
| Novel carrier measurement methodology for floating gate of sub-20 nm node flash memory using scanning nonlinear dielectric microscopy J Hirota, S Takeno, Y Yamagishi, Y Cho International Symposium for Testing and Failure Analysis 81009, 547-549, 2018 | 6 | 2018 |
| Visualization of traps at SiO2/SiC interfaces near the conduction band by local deep level transient spectroscopy at low temperatures T Abe, Y Yamagishi, Y Cho Japanese Journal of Applied Physics 57 (8S1), 08NB12, 2018 | 5 | 2018 |
| High resolution observation of defects at SiO2/4H-SiC interfaces using time-resolved scanning nonlinear dielectric microscopy Y Yamagishi, Y Cho Microelectronics Reliability 88, 242-245, 2018 | 4 | 2018 |
| Local carrier dynamics in organic thin film transistors investigated by time-resolved Kelvin probe force microscopy Y Yamagishi, K Kobayashi, T Kimura, K Noda, H Yamada Organic Electronics 57, 118-122, 2018 | 4 | 2018 |
| Molecular-Resolution Imaging of Interfacial Solvation of Electrolytes for Lithium-Ion Batteries by Frequency Modulation Atomic Force Microscopy Y Yamagishi, H Kominami, K Kobayashi, Y Nomura, E Igaki, H Yamada Nano Letters 22 (24), 9907-9913, 2022 | 3 | 2022 |
| Exploring the Molecular-Scale Structures at Solid/Liquid Interfaces of Li-Ion Battery Materials: A Force Spectroscopy Analysis with Sparse Modeling Y Yamagishi, S Ohuchi, E Igaki, K Kobayashi Nano Letters, 2024 | 1 | 2024 |
| Nanoscale visualization of fast carrier dynamics in organic thin-film transistors by time-resolved electrostatic force microscopy Y Yamagishi, K Kobayashi, T Kimura, K Noda, H Yamada Journal of Applied Physics 135 (12), 2024 | | 2024 |
| High Resolution Mapping of Defects at SiO2/SiC Interfaces by Local-DLTS Based on Time-Resolved Scanning Nonlinear Dielectric Microscopy Y Yamagishi, Y Cho 2019 IEEE 26th International Symposium on Physical and Failure Analysis of …, 2019 | | 2019 |
| High Resolution Observation of Subsurface Defects at SiO2/4H-SiC Interfaces by Local Deep Level Transient Spectroscopy Based on Time-Resolved Scanning … Y Yamagishi, Y Cho 2019 IEEE International Reliability Physics Symposium (IRPS), 1-4, 2019 | | 2019 |
| High Resolution Mapping of Subsurface Defects at SiO2/SiC Interfaces by Time-Resolved Scanning Nonlinear Dielectric Microscopy Y Yamagishi, Y Cho International Symposium for Testing and Failure Analysis 81009, 534-537, 2018 | | 2018 |
| Improvement of Local Deep Level Transient Spectroscopy for Microscopic Evaluation of SiO2/4H-SiC Interfaces Y Yamagishi, Y Cho Materials Science Forum 924, 289-292, 2018 | | 2018 |
Yasuo Cho東北大学電気通信研究所在 riec.tohoku.ac.jp 的电子邮件经过验证
