Sface: Sigmoid-constrained hypersphere loss for robust face recognition Y Zhong, W Deng, J Hu, D Zhao, X Li, D Wen IEEE Transactions on Image Processing 30, 2587-2598, 2021 | 113 | 2021 |
Global-local gcn: Large-scale label noise cleansing for face recognition Y Zhang, W Deng, M Wang, J Hu, X Li, D Zhao, D Wen Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2020 | 75 | 2020 |
Knowledge representing: Efficient, sparse representation of prior knowledge for knowledge distillation J Liu, D Wen, H Gao, W Tao, TW Chen, K Osa, M Kato Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2019 | 22 | 2019 |
Ifq-net: Integrated fixed-point quantization networks for embedded vision H Gao, W Tao, D Wen, TW Chen, K Osa, M Kato Proceedings of the IEEE Conference on Computer Vision and Pattern …, 2018 | 16 | 2018 |
Dynamic training data dropout for robust deep face recognition Y Zhong, W Deng, H Fang, J Hu, D Zhao, X Li, D Wen IEEE Transactions on Multimedia 24, 1186-1197, 2021 | 15 | 2021 |
Adaptive label noise cleaning with meta-supervision for deep face recognition Y Zhang, W Deng, Y Zhong, J Hu, X Li, D Zhao, D Wen Proceedings of the IEEE/CVF International Conference on Computer Vision …, 2021 | 11 | 2021 |
Gradient attention balance network: Mitigating face recognition racial bias via gradient attention L Huang, M Wang, J Liang, W Deng, H Shi, D Wen, Y Zhang, J Zhao Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2023 | 7 | 2023 |
Cassod-net: Cascaded and separable structures of dilated convolution for embedded vision systems and applications TW Chen, D Wang, W Tao, D Wen, L Yin, T Ito, K Osa, M Kato Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2021 | 7 | 2021 |
QuantNet: Learning to quantize by learning within fully differentiable framework J Liu, D Wen, D Wang, W Tao, TW Chen, K Osa, M Kato Computer Vision–ECCV 2020 Workshops: Glasgow, UK, August 23–28, 2020 …, 2020 | 7 | 2020 |
Condensation-Net: memory-efficient network architecture with cross-channel pooling layers and virtual feature maps TW Chen, M Yoshinaga, H Gao, W Tao, D Wen, J Liu, K Osa, M Kato Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2019 | 6 | 2019 |
Dupnet: Towards very tiny quantized cnn with improved accuracy for face detection H Gao, W Tao, D Wen, J Liu, TW Chen, K Osa, M Kato Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2019 | 6 | 2019 |
Model and data agreement for learning with noisy labels Y Zhang, W Deng, X Cui, Y Yin, H Shi, D Wen arXiv preprint arXiv:2212.01054, 2022 | 5 | 2022 |
Training and application method of a multi-layer neural network model, apparatus and storage medium W Tao, H Gao, T Chen, D Wen, J Liu US Patent 11,847,569, 2023 | 4 | 2023 |
Training and application method apparatus system and stroage medium of neural network model J Liu, T Chen, D Wen, W Tao, D Wang US Patent App. 17/003,384, 2021 | 4 | 2021 |
Fully supervised and guided distillation for one-stage detectors D Wang, D Wen, J Liu, W Tao, TW Chen, K Osa, M Kato Proceedings of the Asian Conference on Computer Vision, 2020 | 4 | 2020 |
Training method and training apparatus for a neural network for object recognition D Zhao, D Wen, X Li, W Deng, J Hu US Patent 12,026,974, 2024 | 3 | 2024 |
Method and Apparatus for training an object recognition model D Zhao, D Wen, X Li, W Deng, J Hu US Patent App. 17/089,583, 2021 | 3 | 2021 |
Training and application method of a multi-layer neural network model, apparatus and storage medium H Gao, W Tao, TW Chen, D Wen, J Liu US Patent App. 16/721,624, 2020 | 3 | 2020 |
Dive into the Resolution Augmentations and Metrics in Low Resolution Face Recognition: A Plain yet Effective New Baseline X Ling, Y Lu, W Xu, W Deng, Y Zhang, X Cui, H Shi, D Wen arXiv preprint arXiv:2302.05621, 2023 | 2 | 2023 |
Improving autism spectrum disorder prediction by fusion of multiple measures of resting-state functional MRI data L Liang, G Dong, C Li, D Wen, Y Zhao, J Li 2022 44th Annual International Conference of the IEEE Engineering in …, 2022 | 2 | 2022 |