| Effects of three-dimensional coating interfaces on thermo-mechanical stresses within plasma spray thermal barrier coatings S Kyaw, A Jones, MAE Jepson, T Hyde, RC Thomson Materials & Design 125, 189-204, 2017 | 60 | 2017 |
| Energy selective scanning electron microscopy to reduce the effect of contamination layers on scanning electron microscope dopant mapping C Rodenburg, MAE Jepson, EGT Bosch, M Dapor Ultramicroscopy 110 (9), 1185-1191, 2010 | 43 | 2010 |
| Microstructural evolution of boron nitride particles in advanced 9Cr power plant steels L Li, R MacLachlan, MAE Jepson, R Thomson Metallurgical and Materials Transactions A 44 (7), 3411-3418, 2013 | 40 | 2013 |
| The influence of microstructure on the oxidation of duplex stainless steels in simulated propane combustion products at 1000° C MAE Jepson, RL Higginson Corrosion Science 51 (3), 588-594, 2009 | 33 | 2009 |
| In-situ Observation of the Oxidation of S32101 Duplex Stainless Steel at 900° C MAE Jepson, RL Higginson Corrosion Science, 2012 | 26 | 2012 |
| Use of EBSD to characterise high temperature oxides formed on low alloy and stainless steels RL Higginson, MAE Jepson, GD West Materials Science and Technology 22 (11), 1325-1332, 2006 | 26 | 2006 |
| Comparison of the effects of a conventional heat treatment between cast and selective laser melted IN939 alloy W Philpott, MAE Jepson, RC Thomson © Electric Power Research Institute (EPRI). Distributed by ASM International, 2016 | 22* | 2016 |
| Effect of rejuvenation heat treatments on gamma prime distributions in a Ni based superalloy for power plant applications Z Yao, CC Degnan, MAE Jepson, RC Thomson Materials Science and Technology 29 (7), 775-780, 2013 | 22 | 2013 |
| Dopant contrast in the helium ion microscope MAE Jepson, BJ Inkson, C Rodenburg, DC Bell EPL (Europhysics Letters) 85, 46001, 2009 | 20 | 2009 |
| Quantitative dopant contrast in the helium ion microscope MAE Jepson, BJ Inkson, X Liu, L Scipioni, C Rodenburg EPL (Europhysics Letters) 86, 26005, 2009 | 18 | 2009 |
| Microstructural and Chemical Rejuvenation of a Ni-Based Superalloy Z Yao, CC Degnan, MAE Jepson, RC Thomson Metallurgical and Materials Transactions A 47 (12), 6330-6338, 2016 | 17 | 2016 |
| The Effect of Oxide Overlayers on Secondary Electron Dopant Mapping M Dapor, MAE Jepson, BJ Inkson, C Rodenburg Microscopy and Microanalysis 15 (03), 237-243, 2009 | 17 | 2009 |
| The use of EBSD to study the microstructural development of oxide scales on 316 stainless steel M Jepson, RL Higginson Materials at High Temperatures 22 (3-4), 3-4, 2005 | 15 | 2005 |
| Resolution Limits of Secondary Electron Dopant Contrast in Helium Ion and Scanning Electron Microscopy M Jepson, X Liu, D Bell, D Ferranti, B Inkson, C Rodenburg Microscopy and Microanalysis 17 (04), 637-642, 2011 | 14 | 2011 |
| Surface morphology of silica nanowires at the nanometer scale C Rodenburg, X Liu, MAE Jepson, SA Boden, G Brambilla Journal of Non-Crystalline Solids, 2011 | 9 | 2011 |
| Energy filtered scanning electron microscopy: Applications to characterisation of semiconductors C Rodenburg, MAE Jepson, BJ Inkson, EGT Bosch, CJ Humphreys Journal of Physics: Conference Series 241 (1), 012074, 2010 | 9 | 2010 |
| The effect of oxidation and carbon contamination on SEM dopant contrast MAE Jepson, K Khan, TJ Hayward, BJ Inkson, C Rodenburg Journal of Physics: Conference Series 241, 012078, 2010 | 9 | 2010 |
| The effect of surface preparation on the precipitation of sigma during high temperature exposure of S32205 duplex stainless steel MAE Jepson, M Rowlett, RL Higginson Metallurgical and Materials Transactions A 48 (3), 1491-1500, 2017 | 8 | 2017 |
| Dopant contrast in the Helium Ion Microscope: contrast mechanism C Rodenburg, MAE Jepson, BJ Inkson, X Liu Journal of Physics: Conference Series 241, 012076, 2010 | 8 | 2010 |
| The role of helium ion microscopy in the characterisation of complex three-dimensional nanostructures C Rodenburg, X Liu, MAE Jepson, Z Zhou, WM Rainforth, JM Rodenburg Ultramicroscopy 110 (9), 1178-1184, 2010 | 7 | 2010 |
C RodenburgUniversity of Sheffield在 sheffield.ac.uk 的电子邮件经过验证
