| Fine-grained aging-induced delay prediction based on the monitoring of run-time stress A Vijayan, A Koneru, S Kiamehr, K Chakrabarty, MB Tahoori IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2016 | 41 | 2016 |
| Fine-grained aging prediction based on the monitoring of run-time stress using DfT infrastructure A Koneru, A Vijayan, K Chakrabarty, MB Tahoori 2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 51-58, 2015 | 18 | 2015 |
| Online soft-error vulnerability estimation for memory arrays and logic cores A Vijayan, S Kiamehr, M Ebrahimi, K Chakrabarty, MB Tahoori IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2017 | 16 | 2017 |
| Re-using BIST for circuit aging monitoring F Firouzi, F Ye, A Vijayan, A Koneru, K Chakrabarty, MB Tahoori 2015 20th IEEE European Test Symposium (ETS), 1-2, 2015 | 16 | 2015 |
| Runtime identification of hardware Trojans by feature analysis on gate-level unstructured data and anomaly detection A Vijayan, MB Tahoori, K Chakrabarty ACM Transactions on Design Automation of Electronic Systems (TODAES) 25 (4 …, 2020 | 10 | 2020 |
| Dynamic faults based hardware trojan design in stt-mram SM Nair, R Bishnoi, A Vijayan, MB Tahoori 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 933-938, 2020 | 8 | 2020 |
| Machine learning-based aging analysis A Vijayan, K Chakrabarty, MB Tahoori Machine Learning in VLSI Computer-Aided Design, 265-289, 2019 | 8 | 2019 |
| Workload-aware static aging monitoring and mitigation of timing-critical flip-flops A Vijayan, S Kiamehr, F Oboril, K Chakrabarty, MB Tahoori IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2017 | 7 | 2017 |
| Online soft-error vulnerability estimation for memory arrays A Vijayan, A Koneru, M Ebrahimit, K Chakrabarty, MB Tahoori 2016 IEEE 34th VLSI Test Symposium (VTS), 1-6, 2016 | 7 | 2016 |
| Workload-aware static aging monitoring of timing-critical flip-flops A Vijayan, S Kiamehr, F Oboril, K Chakrabarty, MB Tahoori 2017 22nd Asia and South Pacific Design Automation Conference (ASP-DAC), 176-181, 2017 | 3 | 2017 |
| Self-awareness and self-learning for resiliency in real-time systems MB Tahoori, A Chatterjee, K Chakrabarty, A Koneru, A Vijayan, ... 2015 IEEE 21st International On-Line Testing Symposium (IOLTS), 128-131, 2015 | 1 | 2015 |
| A Data-driven Approach for Fault Detection in the Alternator Unit of Automotive Systems A Vijayan, MB Tahoori, E Kintzli, T Lohmann, JH Handl 2022 IEEE European Test Symposium (ETS), 1-4, 2022 | | 2022 |
| Runtime Monitoring for Dependable Hardware Design A Vijayan Dissertation, Karlsruhe, Karlsruher Institut für Technologie (KIT), 2019, 2019 | | 2019 |
