| Mixture importance sampling and its application to the analysis of SRAM designs in the presence of rare failure events R Kanj, R Joshi, S Nassif Proceedings of the 43rd annual Design Automation Conference, 69-72, 2006 | 401 | 2006 |
| Low cost arduino/android-based energy-efficient home automation system with smart task scheduling K Baraka, M Ghobril, S Malek, R Kanj, A Kayssi 2013 Fifth international conference on computational intelligence …, 2013 | 203 | 2013 |
| Document retrieval using internal dictionary-hierarchies to adjust per-subject match results AE Gattiker, FH Gebara, AN Hylick, RN Kanj US Patent 9,235,638, 2016 | 177 | 2016 |
| Method and computer program for efficient cell failure rate estimation in cell arrays RV Joshi, RN Kanj, SR Nassif US Patent 7,380,225, 2008 | 131 | 2008 |
| Methodology for correlated memory fail estimations RV Joshi, RN Kanj, SR Nassif US Patent 8,214,190, 2012 | 111 | 2012 |
| Bayesian model fusion: large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data F Wang, W Zhang, S Sun, X Li, C Gu Proceedings of the 50th Annual Design Automation Conference, 1-6, 2013 | 104 | 2013 |
| In-situ design method and system for improved memory yield RV Joshi, R Kanj US Patent 8,170,857, 2012 | 104 | 2012 |
| Noninvasive, wearable, and tunable electromagnetic multisensing system for continuous glucose monitoring, mimicking vasculature anatomy J Hanna, M Bteich, Y Tawk, AH Ramadan, B Dia, FA Asadallah, A Eid, ... Science Advances 6 (24), eaba5320, 2020 | 85 | 2020 |
| The impact of aging effects and manufacturing variation on SRAM soft-error rate EH Cannon, AJ KleinOsowski, R Kanj, DD Reinhardt, RV Joshi IEEE Transactions on Device and Materials Reliability 8 (1), 145-152, 2008 | 72 | 2008 |
| Cross layer error exploitation for aggressive voltage scaling AK Djahromi, AM Eltawil, FJ Kurdahi, R Kanj 8th International Symposium on Quality Electronic Design (ISQED'07), 192-197, 2007 | 58 | 2007 |
| A novel column-decoupled 8T cell for low-power differential and domino-based SRAM design RV Joshi, R Kanj, V Ramadurai IEEE Transactions on Very Large Scale Integration (VLSI) Systems 19 (5), 869-882, 2010 | 56 | 2010 |
| Feature extraction that supports progressively refined search and classification of patterns in a semiconductor layout DL DeMaris, RN Kanj, DN Maynard, MD Monkowski US Patent App. 11/765,473, 2008 | 47 | 2008 |
| System-level SRAM yield enhancement FJ Kurdahi, AM Eltawil, YH Park, RN Kanj, SR Nassif 7th International Symposium on Quality Electronic Design (ISQED'06), 6 pp.-184, 2006 | 40 | 2006 |
| A disturb decoupled column select 8T SRAM cell V Ramadurai, R Joshi, R Kanj 2007 IEEE Custom Integrated Circuits Conference, 25-28, 2007 | 36 | 2007 |
| A thermal and process variation aware MTJ switching model and its applications in soft error analysis P Wang, W Zhang, R Joshi, R Kanj, Y Chen Proceedings of the International Conference on Computer-Aided Design, 720-727, 2012 | 34 | 2012 |
| FinFET SRAM design R Joshi, K Kim, R Kanj Nanoelectronic Circuit Design, 55-95, 2011 | 32 | 2011 |
| Strained SOI FinFET SRAM Design P Kerber, R Kanj, RV Joshi IEEE electron device letters 34 (7), 876-878, 2013 | 24 | 2013 |
| Technology computer-aided design (TCAD)-based virtual fabrication RV Joshi, RN Kanj, K Kim US Patent 8,515,724, 2013 | 23 | 2013 |
| Systems and methods for memory device precharging JW Dawson, RV Joshi, N Jungmann, E Kachir, RN Kanj, E Nir, DW Plass US Patent 8,472,271, 2013 | 21 | 2013 |
| Statistical exploration of the dual supply voltage space of a 65nm PD/SOI CMOS SRAM cell R Joshi, R Kanj, S Nassif, D Plass, Y Chan 2006 European Solid-State Device Research Conference, 315-318, 2006 | 21 | 2006 |
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